{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T17:19:26Z","timestamp":1780593566806,"version":"3.54.1"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T00:00:00Z","timestamp":1606089600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T00:00:00Z","timestamp":1606089600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T00:00:00Z","timestamp":1606089600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,23]]},"DOI":"10.1109\/ats49688.2020.9301569","type":"proceedings-article","created":{"date-parts":[[2020,12,28]],"date-time":"2020-12-28T20:57:55Z","timestamp":1609189075000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets"],"prefix":"10.1109","author":[{"given":"Aibin","family":"Yan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yan","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jie","family":"Cui","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tianming","family":"Ni","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Patrick","family":"Girard","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653591"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2012.6268665"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2955865"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2788439"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2304658"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2956601"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1587\/elex.15.20171129"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2958109"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2876243"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.00006"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-019-05791-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353583"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126615500073"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714841"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126616501632"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5533-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2019.03.005"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2756441"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2318326"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2879341"}],"event":{"name":"2020 IEEE 29th Asian Test Symposium (ATS)","location":"Penang, Malaysia","start":{"date-parts":[[2020,11,23]]},"end":{"date-parts":[[2020,11,26]]}},"container-title":["2020 IEEE 29th Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9301474\/9301477\/09301569.pdf?arnumber=9301569","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:45:46Z","timestamp":1656344746000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9301569\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,23]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ats49688.2020.9301569","relation":{},"subject":[],"published":{"date-parts":[[2020,11,23]]}}}