{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:52:45Z","timestamp":1730199165103,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61702041"],"award-info":[{"award-number":["61702041"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,14]]},"DOI":"10.1109\/ats59501.2023.10317957","type":"proceedings-article","created":{"date-parts":[[2023,11,20]],"date-time":"2023-11-20T19:09:33Z","timestamp":1700507373000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Software Fault Localization Based on Combining Information Retrieval and Mutation Analysis*"],"prefix":"10.1109","author":[{"given":"Lei","family":"Yue","sequence":"first","affiliation":[{"name":"School of Computer Science, Beijing Information Science and Technology University,Beijing,China"}]},{"given":"Jingwen","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer Science, Beijing Information Science and Technology University,Beijing,China"}]},{"given":"Liwei","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Computer Science, Beijing Information Science and Technology University,Beijing,China"}]},{"given":"Li","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer Science, Beijing Information Science and Technology University,Beijing,China"}]},{"given":"Zhanqi","family":"Cui","sequence":"additional","affiliation":[{"name":"School of Computer Science, Beijing Information Science and Technology University,Beijing,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2892102"},{"issue":"2","key":"ref3","first-page":"247","article-title":"Survey on information retrieval-based software bug localization methods[J]","volume":"32","author":"Li","year":"2021","journal-title":"Journal of Software"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2014.28"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1509"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2285319"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00067"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1985441.1985451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227210"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610386"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2021.3071473"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-023-00379-9"},{"issue":"1","key":"ref13","first-page":"4008","article-title":"Fine-grained bug location method based on source code extension information[J]","volume":"33","author":"Li","year":"2021","journal-title":"Journal of Software"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2948158"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510136"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/icse.2017.62"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510147"}],"event":{"name":"2023 IEEE 32nd Asian Test Symposium (ATS)","start":{"date-parts":[[2023,10,14]]},"location":"Beijing, China","end":{"date-parts":[[2023,10,17]]}},"container-title":["2023 IEEE 32nd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10317938\/10317940\/10317957.pdf?arnumber=10317957","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,12]],"date-time":"2024-04-12T05:57:37Z","timestamp":1712901457000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10317957\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,14]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/ats59501.2023.10317957","relation":{},"subject":[],"published":{"date-parts":[[2023,10,14]]}}}