{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,22]],"date-time":"2025-12-22T18:29:48Z","timestamp":1766428188227,"version":"3.37.3"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"NSFC of China","doi-asserted-by":"publisher","award":["61974001,62274052"],"award-info":[{"award-number":["61974001,62274052"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,14]]},"DOI":"10.1109\/ats59501.2023.10317977","type":"proceedings-article","created":{"date-parts":[[2023,11,20]],"date-time":"2023-11-20T19:09:33Z","timestamp":1700507373000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications"],"prefix":"10.1109","author":[{"given":"Aibin","family":"Yan","sequence":"first","affiliation":[{"name":"School of Computer Science and Technology, Anhui University,Hefei,China"}]},{"given":"Xuehua","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Anhui University,Hefei,China"}]},{"given":"Zhongyu","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Anhui University,Hefei,China"}]},{"given":"Zhengfeng","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology,Hefei,China"}]},{"given":"Tianming","family":"Ni","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Anhui Polytechnic University,Wuhu,China"}]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[{"name":"Kyushu Institute of Technology,Department of Computer Science and Networks,Fukuoka,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2899611"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353583"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.2966200"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2260357"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2281138"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2169457"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISICIR.2016.7829721"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9181135"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2872507"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2032090"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2728180"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3018328"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/icam.2017.8242164"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2011.2167233"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2876243"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2788439"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2718029"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E101.A.1025"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.02.012"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E98.C.1171"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/el.2018.0558"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282145"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2016.7684062"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2939380"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tetc.2017.2776285"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2019.2925448"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2018.2871861"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2959007"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH53687.2021.9642250"}],"event":{"name":"2023 IEEE 32nd Asian Test Symposium (ATS)","start":{"date-parts":[[2023,10,14]]},"location":"Beijing, China","end":{"date-parts":[[2023,10,17]]}},"container-title":["2023 IEEE 32nd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10317938\/10317940\/10317977.pdf?arnumber=10317977","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,13]],"date-time":"2024-04-13T04:13:14Z","timestamp":1712981594000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10317977\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,14]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/ats59501.2023.10317977","relation":{},"subject":[],"published":{"date-parts":[[2023,10,14]]}}}