{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T14:35:44Z","timestamp":1742394944535},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002347","name":"German Federal Ministry of Education and Research (BMBF)","doi-asserted-by":"publisher","award":["16ME0132"],"award-info":[{"award-number":["16ME0132"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,14]]},"DOI":"10.1109\/ats59501.2023.10317988","type":"proceedings-article","created":{"date-parts":[[2023,11,20]],"date-time":"2023-11-20T19:09:33Z","timestamp":1700507373000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors"],"prefix":"10.1109","author":[{"given":"Nikolaos I.","family":"Deligiannis","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN),Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tobias","family":"Faller","sequence":"additional","affiliation":[{"name":"University of Freiburg,Department of Computer Science,Freiburg,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Iacopo","family":"Guglielminetti","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Riccardo","family":"Cantoro","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN),Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bernd","family":"Becker","sequence":"additional","affiliation":[{"name":"University of Freiburg,Department of Computer Science,Freiburg,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN),Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/test.2009.5355741"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/vtest.1999.766662"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/test.2005.1584040"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2014.2323216"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ats.1994.367253"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/348019.348311"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/vts50974.2021.9441040"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7873\/date.2013.298"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/hldvt.2004.1431252"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ats.2008.22"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2005.855967"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/iccad.1997.643606"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/vtest.2003.1197680"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3062767"},{"journal-title":"CMGen User Guide","year":"2022","key":"ref15"},{"journal-title":"Tessent Shell Reference Manual","article-title":"Siemens EDA","year":"2019","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/itc50671.2022.00043"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10174156"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3186946"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10174232"},{"article-title":"RISC-V International","volume-title":"RISC-V Opcodes","year":"2022","key":"ref21"},{"volume-title":"Open-Cell 45nm FreePDK","key":"ref22"},{"volume-title":"Privileged Specification version 20211203","key":"ref23","article-title":"RISC-V International"}],"event":{"name":"2023 IEEE 32nd Asian Test Symposium (ATS)","start":{"date-parts":[[2023,10,14]]},"location":"Beijing, China","end":{"date-parts":[[2023,10,17]]}},"container-title":["2023 IEEE 32nd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10317938\/10317940\/10317988.pdf?arnumber=10317988","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,13]],"date-time":"2024-04-13T04:22:25Z","timestamp":1712982145000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10317988\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,14]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/ats59501.2023.10317988","relation":{},"subject":[],"published":{"date-parts":[[2023,10,14]]}}}