{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T08:31:30Z","timestamp":1764059490383},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,14]],"date-time":"2023-10-14T00:00:00Z","timestamp":1697241600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,14]]},"DOI":"10.1109\/ats59501.2023.10317989","type":"proceedings-article","created":{"date-parts":[[2023,11,20]],"date-time":"2023-11-20T19:09:33Z","timestamp":1700507373000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning"],"prefix":"10.1109","author":[{"given":"Mu","family":"Nie","sequence":"first","affiliation":[{"name":"Southeast University,Nanjing,China"}]},{"given":"Wen","family":"Jiang","sequence":"additional","affiliation":[{"name":"Anhui Polytechnic University,Wuhu,China"}]},{"given":"Wankou","family":"Yang","sequence":"additional","affiliation":[{"name":"Southeast University,Nanjing,China"}]},{"given":"Senling","family":"Wang","sequence":"additional","affiliation":[{"name":"Ehime University,Matsuyama,Japan"}]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[{"name":"Kyushu Institute of Technology,Iizuka,Japan"}]},{"given":"Tianming","family":"Ni","sequence":"additional","affiliation":[{"name":"Anhui Polytechnic University,Wuhu,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131598"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS52891.2021.00019"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000166"},{"key":"ref4","first-page":"727","article-title":"Mixed-Type Wafer Failure Pattern Recognition (Invited Paper)","volume-title":"2023 28th Asia and South Pacific Design Automation Conference (ASP-DAC)","author":"Geng","year":"2023"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2916835"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.2994357"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW50498.2020.00020"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2021.3134625"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2925361"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2018.2795466"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2019.00156"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.2964581"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.105864"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2021.3118922"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01755-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2019.2897690"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/app12042209"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2022.103720"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/itc50671.2022.00006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2014.2364237"}],"event":{"name":"2023 IEEE 32nd Asian Test Symposium (ATS)","start":{"date-parts":[[2023,10,14]]},"location":"Beijing, China","end":{"date-parts":[[2023,10,17]]}},"container-title":["2023 IEEE 32nd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10317938\/10317940\/10317989.pdf?arnumber=10317989","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,12]],"date-time":"2024-04-12T05:45:36Z","timestamp":1712900736000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10317989\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,14]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ats59501.2023.10317989","relation":{},"subject":[],"published":{"date-parts":[[2023,10,14]]}}}