{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:40:16Z","timestamp":1742017216293,"version":"3.38.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T00:00:00Z","timestamp":1734393600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T00:00:00Z","timestamp":1734393600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,12,17]]},"DOI":"10.1109\/ats64447.2024.10915416","type":"proceedings-article","created":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:45:02Z","timestamp":1741974302000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Formal Approach and Testing Process for Failure Modes in Intelligent Algorithms"],"prefix":"10.1109","author":[{"given":"Nishan","family":"Xie","sequence":"first","affiliation":[{"name":"University of Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongping","family":"Ren","sequence":"additional","affiliation":[{"name":"Institute of Software Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rui","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Software Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qian","family":"Dong","sequence":"additional","affiliation":[{"name":"Institute of Software Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lingzhong","family":"Meng","sequence":"additional","affiliation":[{"name":"Institute of Software Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","article-title":"The numbers don\u2019t lie: Self-driving cars are getting good","author":"Davis","year":"2017","journal-title":"Wired"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssci.2019.06.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IVS.2017.7995703"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-79789-7_8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/0471722324.ch22"},{"issue":"B05","key":"ref6","first-page":"256","article-title":"Software failure mode hazard assessment method","volume":"30","author":"Zhu","year":"2012","journal-title":"Reliability and environmental testing of electronic products"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2013.6517710"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICRMS.2009.5270088"},{"article-title":"Failure modes in machine learning systems","year":"2019","author":"Siva Kumar","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3132747.3132785"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00175"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180220"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC55140.2022.9921776"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-009-0275-4"}],"event":{"name":"2024 IEEE 33rd Asian Test Symposium (ATS)","start":{"date-parts":[[2024,12,17]]},"location":"Ahmedabad, India","end":{"date-parts":[[2024,12,20]]}},"container-title":["2024 IEEE 33rd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10914681\/10915215\/10915416.pdf?arnumber=10915416","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:02:09Z","timestamp":1742014929000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10915416\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,17]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ats64447.2024.10915416","relation":{},"subject":[],"published":{"date-parts":[[2024,12,17]]}}}