{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T15:23:16Z","timestamp":1783610596788,"version":"3.55.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T00:00:00Z","timestamp":1734393600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T00:00:00Z","timestamp":1734393600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,12,17]]},"DOI":"10.1109\/ats64447.2024.10915463","type":"proceedings-article","created":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:45:02Z","timestamp":1741974302000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs"],"prefix":"10.1109","author":[{"given":"Samira","family":"Nazari","sequence":"first","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahdi","family":"Taheri","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ali","family":"Azarpeyvand","sequence":"additional","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohsen","family":"Afsharchi","sequence":"additional","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tara","family":"Ghasempouri","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Herglotz","sequence":"additional","affiliation":[{"name":"Brandenburgische Technische Universität Cottbus,Cottbus,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Masoud","family":"Daneshtalab","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3623402"},{"key":"ref2","article-title":"Dnn hardware reliability assessment and enhancement","volume-title":"27th IEEE European Test Symposium (ETS).","author":"Taheri"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3638242"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED57927.2023.10129353"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED60706.2024.10528372"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10140043"},{"key":"ref7","article-title":"Benchmarking the reliability of post-training quantization: a particular focus on worst-case performance","author":"Yuan","year":"2023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS57966.2023.10168633"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10139468"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS60656.2024.10538707"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS60919.2024.10508925"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/app11146455"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567161"},{"key":"ref14","article-title":"Adam: Adaptive approximate multiplier for fault tolerance in dnn accelerators","author":"Taheri","year":"2024","journal-title":"Authorea Preprints"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2837908"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774543"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774635"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3260309"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045134"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"}],"event":{"name":"2024 IEEE 33rd Asian Test Symposium (ATS)","location":"Ahmedabad, India","start":{"date-parts":[[2024,12,17]]},"end":{"date-parts":[[2024,12,20]]}},"container-title":["2024 IEEE 33rd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10914681\/10915215\/10915463.pdf?arnumber=10915463","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T04:59:24Z","timestamp":1742014764000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10915463\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,17]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ats64447.2024.10915463","relation":{},"subject":[],"published":{"date-parts":[[2024,12,17]]}}}