{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,2]],"date-time":"2026-01-02T07:37:54Z","timestamp":1767339474746,"version":"3.38.0"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T00:00:00Z","timestamp":1734393600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T00:00:00Z","timestamp":1734393600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,12,17]]},"DOI":"10.1109\/ats64447.2024.10915500","type":"proceedings-article","created":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:45:02Z","timestamp":1741974302000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["A Novel Multi-Scope Characterization Method for Automotive LPDDR4 Controller"],"prefix":"10.1109","author":[{"given":"Vasavi","family":"Ghanta","sequence":"first","affiliation":[{"name":"Infineon Technologies,Automotive Microcontroller,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vinodh J","family":"Rakesh","sequence":"additional","affiliation":[{"name":"Infineon Technologies,Automotive Microcontroller,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.11959\/j.issn.2096-1081.2016.002"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MetroCAD56305.2022.00015"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JPROC.2014.2325397"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/APSEC.2016.040"},{"volume-title":"How to ensure functional safety, according to ISO 26262","author":"Brenner","key":"ref5"},{"article-title":"CYT4DN TRAVEO T2G 32-bit Automotive MCU Datasheet","key":"ref6"},{"year":"2017","journal-title":"Low Power Double Data Rate 4 (LPDDR4)","key":"ref7"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/EPEP.2007.4387159"},{"article-title":"D9040DDRC DDR4 and LPDDR4 Compliance Test Software","key":"ref9"},{"article-title":"DDRA and DDR-LP4 Memory Interface Electrical Verification and Debug Datasheet","key":"ref10"},{"article-title":"Automated DDR4 & LPDDR4\/4X Compliance Testing (QPHY-DDR4) Datasheet","key":"ref11"},{"article-title":"U4164A Logic Analyzer Module","key":"ref12"},{"article-title":"M5100 Series Memory Analyzer","key":"ref13"},{"year":"2012","author":"Pupalaikis","journal-title":"Deembedding in High Speed Design","key":"ref14"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/IEMT.2003.1225940"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TEST.2004.1387336"}],"event":{"name":"2024 IEEE 33rd Asian Test Symposium (ATS)","start":{"date-parts":[[2024,12,17]]},"location":"Ahmedabad, India","end":{"date-parts":[[2024,12,20]]}},"container-title":["2024 IEEE 33rd Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10914681\/10915215\/10915500.pdf?arnumber=10915500","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:04:55Z","timestamp":1742015095000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10915500\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,17]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/ats64447.2024.10915500","relation":{},"subject":[],"published":{"date-parts":[[2024,12,17]]}}}