{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:54:16Z","timestamp":1730199256212,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/bcicts.2018.8550897","type":"proceedings-article","created":{"date-parts":[[2018,12,8]],"date-time":"2018-12-08T00:53:02Z","timestamp":1544230382000},"page":"1-5","source":"Crossref","is-referenced-by-count":3,"title":["On-Wafer Transistor Characterization to 750 GHz \u2013 the Approach, Results, and Pitfalls"],"prefix":"10.1109","author":[{"given":"Dylan F.","family":"Williams","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerome","family":"Cheron","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin","family":"Jamroz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Richard","family":"Chamberlin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2003.1210494"},{"key":"ref11","first-page":"92","article-title":"User's reference guide for ODRPACK version 2.01 software for weighted orthogonal distance regression","author":"boggs","year":"1992","journal-title":"Boulder CO NISTIR"},{"key":"ref12","article-title":"NIST Microwave Uncertainty Framework","author":"williams","year":"2011","journal-title":"National Institute of Standards and Technology"},{"journal-title":"VNA-Tools II","year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2432765"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2012.6422429"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG79.2012.6291181"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2014.6899513"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2416180"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2015.7162913"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.1992.326994"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2331623"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/75.91092"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2013.2255332"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2008.4804293"},{"key":"ref8","first-page":"1","article-title":"Sources of Error in Coplanar-Waveguide TRL Calibrations","author":"kaiser","year":"1999","journal-title":"54th ARFTG Conference Digest"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1997.602823"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/75.84601"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2003.819211"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"1205","DOI":"10.1109\/22.85388","article-title":"A multi-line method of network analyzer calibration","volume":"39","author":"marks","year":"1991","journal-title":"IEEE Trans Microw Theory Techn"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2016.7501944"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2018.8423827"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2018.8423818"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2602262"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2016.7501952"},{"key":"ref26","first-page":"297","article-title":"Radiation, multimode propagation, and substrate modes in W-band CPW calibrations","volume":"41","author":"schmuckle","year":"2011","journal-title":"European Microwave Conf"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2016.7751072"}],"event":{"name":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","start":{"date-parts":[[2018,10,15]]},"location":"San Diego, CA","end":{"date-parts":[[2018,10,17]]}},"container-title":["2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8536738\/8550831\/08550897.pdf?arnumber=8550897","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T00:31:06Z","timestamp":1598229066000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8550897\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/bcicts.2018.8550897","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}