{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:54:46Z","timestamp":1730199286400,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,16]],"date-time":"2020-11-16T00:00:00Z","timestamp":1605484800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,16]],"date-time":"2020-11-16T00:00:00Z","timestamp":1605484800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,16]],"date-time":"2020-11-16T00:00:00Z","timestamp":1605484800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,16]]},"DOI":"10.1109\/bcicts48439.2020.9392966","type":"proceedings-article","created":{"date-parts":[[2021,4,9]],"date-time":"2021-04-09T20:10:07Z","timestamp":1617999007000},"page":"1-8","source":"Crossref","is-referenced-by-count":3,"title":["Current collapse and kink effect in GaN RF HEMTs: the key role of the epitaxial buffer"],"prefix":"10.1109","author":[{"given":"Michael J.","family":"Uren","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Kuball","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2860902"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2872513"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2706090"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2297626"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.89.035204"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2813542"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.63.094201"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1149\/2.0211604jss"},{"key":"ref18","first-page":"7","article-title":"TCAD Simulation of Leakage Through Threading Dislocations in GaN-based pn-diodes","volume":"28","author":"dalcanale","year":"2018","journal-title":"Silvaco Standard"},{"key":"ref19","first-page":"253","article-title":"Simulation of Leakage Induced Suppression of Bulk Dynamic RON in Power Switching GaN-on-Si HEMTs","author":"uren","year":"2020","journal-title":"CS-MANTECH"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2216535"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.4793196"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EMICC.2006.282751"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.880825"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2364855"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2499313"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.4964831"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.5010225"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.862702"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3034062"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.3030341"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1149\/07204.0065ecst"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2105460"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2010067"},{"key":"ref26","article-title":"Sub-Micron Resolution Quantitative Electric Field Mapping of Wide-Bandgap Semiconductor Devices","author":"cao","year":"2020","journal-title":"submitted for publication"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2442293"}],"event":{"name":"2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","start":{"date-parts":[[2020,11,16]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2020,11,19]]}},"container-title":["2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9392908\/9392902\/09392966.pdf?arnumber=9392966","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:36:11Z","timestamp":1656344171000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9392966\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,16]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/bcicts48439.2020.9392966","relation":{},"subject":[],"published":{"date-parts":[[2020,11,16]]}}}