{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,30]],"date-time":"2025-05-30T06:08:40Z","timestamp":1748585320696,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,12,5]]},"DOI":"10.1109\/bcicts50416.2021.9682476","type":"proceedings-article","created":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T15:41:07Z","timestamp":1643125267000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance"],"prefix":"10.1109","author":[{"given":"Sebastien","family":"Fregonese","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chhandak","family":"Mukherjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Holger","family":"Rucker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pascal","family":"Chevalier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gerhard","family":"Fischer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Didier","family":"Celi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marina","family":"Deng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marine","family":"Couret","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francois","family":"Marc","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristell","family":"Maneux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Zimmer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"74","DOI":"10.1016\/j.sse.2013.02.027","article-title":"80 ns\/45 GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices","volume":"84","author":"weisz","year":"2013","journal-title":"Solid-State Electronics Elsevier"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS45179.2019.8972757"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2051475"},{"key":"ref13","first-page":"77","article-title":"A 55 nm triple gate oxide 9 metal layers SiGe BiCMOS technology featuring 320 GHz fT \/ 370 GHz fMAX HBT and High-Q Millimeter-Wave Passives","author":"chevalier","year":"2014","journal-title":"IEDM"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2433299"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2766457"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.826587"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2653197"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2019.8730951"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.323909"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2017.7969100"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2019.8901781"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS45179.2019.8972755"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2009.2032025"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2353800"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2011574"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2280114"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2016.7738948"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS45179.2019.8972729"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2025029"},{"key":"ref20","article-title":"Compact hierarchical modeling of bipolar transistors with HICUM","author":"schr\u00f6ter","year":"2010","journal-title":"World Scientific"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2019.107635"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2020.107819"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/14786445508641925"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2020.107900"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-015-0666-0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.092"}],"event":{"name":"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","start":{"date-parts":[[2021,12,5]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2021,12,8]]}},"container-title":["2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9682201\/9682202\/09682476.pdf?arnumber=9682476","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T12:58:01Z","timestamp":1652187481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9682476\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12,5]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/bcicts50416.2021.9682476","relation":{},"subject":[],"published":{"date-parts":[[2021,12,5]]}}}