{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:59:44Z","timestamp":1725717584015},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,16]],"date-time":"2022-10-16T00:00:00Z","timestamp":1665878400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,16]],"date-time":"2022-10-16T00:00:00Z","timestamp":1665878400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,16]]},"DOI":"10.1109\/bcicts53451.2022.10051733","type":"proceedings-article","created":{"date-parts":[[2023,2,27]],"date-time":"2023-02-27T18:44:26Z","timestamp":1677523466000},"page":"90-93","source":"Crossref","is-referenced-by-count":0,"title":["Capacitance Engineering of GaN HEMT Technologies with Recessed Field Plate"],"prefix":"10.1109","author":[{"given":"Kyle M.","family":"Bothe","sequence":"first","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matthew R.","family":"King","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jia","family":"Guo","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yueying","family":"Liu","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Saptha","family":"Sriram","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jeremy","family":"Fisher","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Scott T.","family":"Sheppard","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Basim","family":"Noori","sequence":"additional","affiliation":[{"name":"Wolfspeed,RF Technology Development,Durham"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/GAAS.1996.567625"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/GAAS.2000.906263"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/WMCS49442.2020.9172394"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.02.018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS45179.2019.8972749"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2006.305162"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3146194"},{"key":"ref8","first-page":"127","article-title":"An Optical 0.25um GaN HEMT Technology on 100mm SiC for RF Discrete and Foundry MMIC Products","volume-title":"CS MANTECH","author":"Wood","year":"2013"},{"key":"ref9","article-title":"Optically-Defined 150nm, 28-V GaN HEMT Process for Ka-Band","author":"Bothe","year":"2019","journal-title":"CS MANTECH"}],"event":{"name":"2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","start":{"date-parts":[[2022,10,16]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2022,10,19]]}},"container-title":["2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10051690\/10051691\/10051733.pdf?arnumber=10051733","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T18:41:03Z","timestamp":1707849663000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10051733\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,16]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/bcicts53451.2022.10051733","relation":{},"subject":[],"published":{"date-parts":[[2022,10,16]]}}}