{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T05:11:11Z","timestamp":1750137071695},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,16]],"date-time":"2022-10-16T00:00:00Z","timestamp":1665878400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,16]],"date-time":"2022-10-16T00:00:00Z","timestamp":1665878400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,16]]},"DOI":"10.1109\/bcicts53451.2022.10051755","type":"proceedings-article","created":{"date-parts":[[2023,2,27]],"date-time":"2023-02-27T18:44:26Z","timestamp":1677523466000},"page":"152-155","source":"Crossref","is-referenced-by-count":8,"title":["A 220-294 GHz Power Amplifier with 10-dBm P<sub>sat<\/sub> and 2.2% PAE in 250-nm InP DHBT"],"prefix":"10.1109","author":[{"given":"Teruo","family":"Jyo","sequence":"first","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Hiroshi","family":"Hamada","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Munehiko","family":"Nagatani","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Hitoshi","family":"Wakita","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Ibrahim","family":"Abdo","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Miwa","family":"Mutoh","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Yuta","family":"Shiratori","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]},{"given":"Kenichi","family":"Okada","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology"}]},{"given":"Atsushi","family":"Shirane","sequence":"additional","affiliation":[{"name":"Tokyo Institute of Technology"}]},{"given":"Hiroyuki","family":"Takahashi","sequence":"additional","affiliation":[{"name":"NTT Device Technology Labs,NTT Corporation,Kanagawa,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2777106"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2626340"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2021.3099057"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662424"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005818"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2204923"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2021.3061662"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS48439.2020.9392976"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2011.2139196"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2013.6659190"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2017.8058751"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2015.2451360"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2349872"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993540"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2928849"}],"event":{"name":"2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","start":{"date-parts":[[2022,10,16]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2022,10,19]]}},"container-title":["2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10051690\/10051691\/10051755.pdf?arnumber=10051755","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T18:41:20Z","timestamp":1707849680000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10051755\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,16]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/bcicts53451.2022.10051755","relation":{},"subject":[],"published":{"date-parts":[[2022,10,16]]}}}