{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T05:08:01Z","timestamp":1782968881211,"version":"3.54.5"},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/bigdata.2018.8622643","type":"proceedings-article","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T03:07:18Z","timestamp":1548385638000},"page":"3341-3349","source":"Crossref","is-referenced-by-count":15,"title":["Reliability Characterization of Solid State Drives in a Scalable Production Datacenter"],"prefix":"10.1109","author":[{"given":"Shuwen","family":"Liang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhi","family":"Qiao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jacob","family":"Hochstetler","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Song","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Song","family":"Fu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weisong","family":"Shi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Devesh","family":"Tiwari","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hsing-Bung","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bradley","family":"Settlemyer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Montoya","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"crossref","first-page":"1149","DOI":"10.1109\/4.475701","article-title":"A 3.3 V 32 Mb NAND flash memory with incremental step pulse programming scheme","volume":"30","author":"suh","year":"1995","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2002.996604"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378623"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.833583"},{"key":"ref13","first-page":"497","article-title":"Degradation of tunnel oxide by fn current stress and its effects on data retention characteristics of 90 nm NAND flash memory cells","author":"lee","year":"2003","journal-title":"Proc 41st Annual 2003 IEEE Int Reliability Physics Symp"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2000.843915"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1993.283291"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.1996.488501"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1994.383470"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.1998.688097"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2001.934976"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705335"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558857"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418892"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056062"},{"key":"ref6","first-page":"67","article-title":"Flash reliability in production: The expected and the unexpected","author":"schroeder","year":"2016","journal-title":"FAST"},{"key":"ref29","first-page":"83","article-title":"Erratic erase in etoxTM flash memory array","year":"1993","journal-title":"Proceedings of the 1993 Symposium on VLSI Technology"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2745844.2745848"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555371"},{"key":"ref7","first-page":"521","article-title":"Error patterns in mlc nand flash memory: Measurement, characterization, and analysis","author":"cai","year":"2012","journal-title":"Proceedings of the Conference on Design Automation and Test in Europe EDA Consortium"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2015.49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2015.7208278"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657034"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531977"},{"key":"ref22","article-title":"Write endurance in flash drives: Measurements and analysis","author":"simona boboila","year":"2010"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1994.383410"},{"key":"ref24","first-page":"7","article-title":"Ssd failures in datacenters: What? when? and why?","author":"narayanan","year":"2016","journal-title":"Proceedings of the 9th ACM International on Systems and Storage Conference"},{"key":"ref23","first-page":"2","article-title":"The bleak future of nand flash memory","author":"grupp","year":"2012","journal-title":"Proceedings of the 10th USENIX Conference on File and Storage Technologies"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.266"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2015.26"}],"event":{"name":"2018 IEEE International Conference on Big Data (Big Data)","location":"Seattle, WA, USA","start":{"date-parts":[[2018,12,10]]},"end":{"date-parts":[[2018,12,13]]}},"container-title":["2018 IEEE International Conference on Big Data (Big Data)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610059\/8621858\/08622643.pdf?arnumber=8622643","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T23:59:46Z","timestamp":1643241586000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8622643\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/bigdata.2018.8622643","relation":{},"subject":[],"published":{"date-parts":[[2018,12]]}}}