{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T06:44:39Z","timestamp":1757313879205},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/bigdata47090.2019.9006446","type":"proceedings-article","created":{"date-parts":[[2020,2,25]],"date-time":"2020-02-25T06:05:34Z","timestamp":1582610734000},"page":"200-205","source":"Crossref","is-referenced-by-count":4,"title":["An Interactive Data Quality Test Approach for Constraint Discovery and Fault Detection"],"prefix":"10.1109","author":[{"given":"Hajar","family":"Homayouni","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sudipto","family":"Ghosh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Indrakshi","family":"Ray","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael G","family":"Kahn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Neural Networks for Pattern Recognition","year":"1995","author":"bishop","key":"ref10"},{"journal-title":"UCI ML Repository","year":"2019","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-30671-1_4"},{"journal-title":"Scaling","year":"2019","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfds.2017.05.001"},{"journal-title":"Learning From Data Concepts Theory and Methods","year":"0","author":"cherkassky","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s13347-017-0293-z"},{"journal-title":"Outlier Detection Datasets","year":"2019","key":"ref17"},{"journal-title":"HDC","year":"2019","key":"ref18"},{"journal-title":"CSU Plant Diagnostic Clinic","year":"2019","key":"ref19"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898718348"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRI.2019.00023"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2015.08.220"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-47578-3_1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/5.58325"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3097983.3098052"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2009.2017477"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10100-017-0479-6"},{"journal-title":"Informatica","year":"2019","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-16248-0_54"},{"journal-title":"Patient Safety Errors are Common with Electronic Health Record Use","year":"2019","key":"ref1"},{"journal-title":"Achilles","year":"2019","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/170036.170072"},{"journal-title":"Murdock","year":"2019","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.2352\/ISSN.2470-1173.2017.9.IRIACV-272"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-804291-5.00003-9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2009.05.029"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"}],"event":{"name":"2019 IEEE International Conference on Big Data (Big Data)","start":{"date-parts":[[2019,12,9]]},"location":"Los Angeles, CA, USA","end":{"date-parts":[[2019,12,12]]}},"container-title":["2019 IEEE International Conference on Big Data (Big Data)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8986695\/9005444\/09006446.pdf?arnumber=9006446","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:50:30Z","timestamp":1658094630000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9006446\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/bigdata47090.2019.9006446","relation":{},"subject":[],"published":{"date-parts":[[2019,12]]}}}