{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:49:17Z","timestamp":1725716957021},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,12,17]]},"DOI":"10.1109\/bigdata55660.2022.10020241","type":"proceedings-article","created":{"date-parts":[[2023,1,26]],"date-time":"2023-01-26T14:35:23Z","timestamp":1674743723000},"page":"6784-6786","source":"Crossref","is-referenced-by-count":0,"title":["Inspection of unexpected defective products by semi-supervised learning based on a probability density function in high-yield food production"],"prefix":"10.1109","author":[{"given":"Masahiro","family":"Nakahara","sequence":"first","affiliation":[{"name":"Ishida tec Co., Ltd.,Yaizu,Japan"}]},{"given":"Yuichi","family":"Mashiba","sequence":"additional","affiliation":[{"name":"University of Tsukuba,Graduate School of Science and Technology,Tsukuba,Japan"}]},{"given":"Ryusuke","family":"Miyamoto","sequence":"additional","affiliation":[{"name":"Tokyo University of Marine Science and Technology,Department of Marine Biosciences,Minato-ku,Japan"}]},{"given":"Yuki","family":"Fujita","sequence":"additional","affiliation":[{"name":"Saitama University,Information Technology Center,Saitama,Japan"}]},{"given":"Hisashi","family":"Ishida","sequence":"additional","affiliation":[{"name":"Ishida tec Co., Ltd.,Yaizu,Japan"}]},{"given":"Keiichi","family":"Zempo","sequence":"additional","affiliation":[{"name":"University of Tsukuba,Faculty of Engineering, Information and Systems,Tsukuba,Japan"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-68799-1_35"},{"article-title":"Very deep convolutional networks for large-scale image recognition","year":"2014","author":"simonyan","key":"ref7"},{"article-title":"Student-teacher feature pyramid matching for unsupervised anomaly detection","year":"2021","author":"wang","key":"ref9"},{"article-title":"Fastflow: Unsupervised anomaly detection and localization via 2d normalizing flows","year":"2021","author":"yu","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-020-01400-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3193699"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00867"},{"key":"ref10","first-page":"622","article-title":"Ganomaly: Semi-supervised anomaly detection via adversarial training","author":"akcay","year":"2018","journal-title":"Asian Conference on Computer Vision"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00982"},{"article-title":"Deep learning for anomaly detection: A survey","year":"2019","author":"chalapathy","key":"ref1"}],"event":{"name":"2022 IEEE International Conference on Big Data (Big Data)","start":{"date-parts":[[2022,12,17]]},"location":"Osaka, Japan","end":{"date-parts":[[2022,12,20]]}},"container-title":["2022 IEEE International Conference on Big Data (Big Data)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10020192\/10020156\/10020241.pdf?arnumber=10020241","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,20]],"date-time":"2023-02-20T17:10:04Z","timestamp":1676913004000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10020241\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12,17]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/bigdata55660.2022.10020241","relation":{},"subject":[],"published":{"date-parts":[[2022,12,17]]}}}