{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:28:40Z","timestamp":1740101320993,"version":"3.37.3"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000993","name":"Battelle","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000993","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,12,17]]},"DOI":"10.1109\/bigdata55660.2022.10020429","type":"proceedings-article","created":{"date-parts":[[2023,1,26]],"date-time":"2023-01-26T19:35:23Z","timestamp":1674761723000},"page":"1936-1941","source":"Crossref","is-referenced-by-count":1,"title":["MatPhase: Material phase prediction for Li-ion Battery Reconstruction using Hierarchical Curriculum Learning"],"prefix":"10.1109","author":[{"given":"Anika","family":"Tabassum","sequence":"first","affiliation":[{"name":"Oak Ridge National Laboratory"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nikhil","family":"Muralidhar","sequence":"additional","affiliation":[{"name":"Stevens Institute of Technology,Department of Computer Science"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramakrishnan","family":"Kannan","sequence":"additional","affiliation":[{"name":"Oak Ridge National Laboratory"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Srikanth","family":"Allu","sequence":"additional","affiliation":[{"name":"Oak Ridge National Laboratory"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1039\/C7SE00498B"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2644615"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298965"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16233-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1137\/17m1155363"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acsaem.8b00501"},{"key":"ref9","article-title":"We know where we don\u2019t know: 3d bayesian cnns for uncertainty quantification of binary segmentations for material simulations","volume-title":"Tech. Rep","author":"LaBonte","year":"2020"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3069908"},{"article-title":"Curriculum by smoothing","volume-title":"Proc. of NeurIPS","author":"Sinha","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.24963\/ijcai.2021\/337"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-87193-2_43"},{"article-title":"Idk cascades: Fast deep learning by learning not to overthink","year":"2017","author":"Wang","key":"ref14"},{"key":"ref15","first-page":"1050","article-title":"Dropout as a bayesian approximation: Representing model uncertainty in deep learning","volume-title":"international conference on machine learning","author":"Gal"},{"article-title":"Leveraging uncertainty estimates for predicting segmentation quality","year":"2018","author":"DeVries","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.elecom.2015.09.010"},{"key":"ref18","article-title":"Rethinking atrous convolution for semantic image segmentation","volume-title":"Conference on CVPR. IEEE\/CVF","volume":"6","author":"Florian"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3025372"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-00889-5_1"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"}],"event":{"name":"2022 IEEE International Conference on Big Data (Big Data)","start":{"date-parts":[[2022,12,17]]},"location":"Osaka, Japan","end":{"date-parts":[[2022,12,20]]}},"container-title":["2022 IEEE International Conference on Big Data (Big Data)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10020192\/10020156\/10020429.pdf?arnumber=10020429","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T07:59:55Z","timestamp":1707811195000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10020429\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12,17]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/bigdata55660.2022.10020429","relation":{},"subject":[],"published":{"date-parts":[[2022,12,17]]}}}