{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:51:22Z","timestamp":1725717082621},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,12,17]]},"DOI":"10.1109\/bigdata55660.2022.10020668","type":"proceedings-article","created":{"date-parts":[[2023,1,26]],"date-time":"2023-01-26T19:35:23Z","timestamp":1674761723000},"page":"6633-6635","source":"Crossref","is-referenced-by-count":0,"title":["Dynamic Power Reduction of TCAM Using Selective Precharging of Match Lines"],"prefix":"10.1109","author":[{"given":"Su-Yeon","family":"Doo","sequence":"first","affiliation":[{"name":"Sungkyunkwan University,Department of Semiconductor and Display Engineering,Suwon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kee-Won","family":"Kwon","sequence":"additional","affiliation":[{"name":"Sungkyunkwan University,Department of Semiconductor and Display Engineering,Suwon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.864128"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/el.2017.1027"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.916624"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2274888"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351461"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837979"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/mwscas.2017.8053021"}],"event":{"name":"2022 IEEE International Conference on Big Data (Big Data)","start":{"date-parts":[[2022,12,17]]},"location":"Osaka, Japan","end":{"date-parts":[[2022,12,20]]}},"container-title":["2022 IEEE International Conference on Big Data (Big Data)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10020192\/10020156\/10020668.pdf?arnumber=10020668","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T08:30:54Z","timestamp":1707813054000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10020668\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12,17]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/bigdata55660.2022.10020668","relation":{},"subject":[],"published":{"date-parts":[[2022,12,17]]}}}