{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,19]],"date-time":"2025-09-19T11:25:24Z","timestamp":1758281124927,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,15]],"date-time":"2023-12-15T00:00:00Z","timestamp":1702598400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,15]],"date-time":"2023-12-15T00:00:00Z","timestamp":1702598400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100018693","name":"Horizon Europe","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100018693","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,15]]},"DOI":"10.1109\/bigdata59044.2023.10386849","type":"proceedings-article","created":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T18:28:47Z","timestamp":1705948127000},"page":"5835-5841","source":"Crossref","is-referenced-by-count":1,"title":["A Study to Compare YOLO Family Models for Metal Surface Anomaly Detection"],"prefix":"10.1109","author":[{"given":"Abd\u00fcsselam","family":"Ko\u00e7","sequence":"first","affiliation":[{"name":"TED University,Faculty of Computer Engineering,Ankara,Turkey"}]},{"given":"\u00d6zlem","family":"Albayrak","sequence":"additional","affiliation":[{"name":"TED University,Faculty of Computer Engineering,Ankara,Turkey"}]},{"given":"Ya\u015far","family":"Kurt","sequence":"additional","affiliation":[{"name":"Research & Development TEKNOPAR Industrial Automation, Ostim Technical University Graduation School of Engineering and Sciences,Ankara,Turkey"}]},{"given":"Perin","family":"\u00dcnal","sequence":"additional","affiliation":[{"name":"Ostim Technical University,Graduation School of Engineering and Sciences"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-8129-5_141"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s22166223"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3224023"},{"key":"ref4","article-title":"Incorporating feedback into tree-based anomaly detection","author":"Das","year":"2017","journal-title":"arXiv preprint arXiv:1708.09441"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2021.12.061"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-55180-3_37"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2017.7966162"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3224023"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109454"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CAC53003.2021.9728621"},{"key":"ref11","first-page":"1329","article-title":"Real-Time Defect Detection of Metal Surface Based on Improved YOLOv4","volume":"18","author":"Liu","year":"2022","journal-title":"International Journal of Innovative Computing, Information and Control"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3083060"},{"volume-title":"NEU-DET Data Set","year":"2023","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2021.122717"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.18280\/ts.390238"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3219819.3220083"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2012.2215319"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/s20123336"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/BigData55660.2022.10020608"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3151560"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-10464-0_11"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.18280\/ts.390614"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2018.00068"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/a13080195"},{"issue":"02","key":"ref25","first-page":"447","article-title":"Application of YOLOV4 Algorithm with Integrated Attention Mechanism in Metal Surface Defect Detection","volume":"19","author":"Xikun","year":"2023","journal-title":"International Journal of Innovative Computing, Information and Control"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/a14090257"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM50108.2020.00086"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12500"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.02.004"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112776"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s13042-022-01744-y"}],"event":{"name":"2023 IEEE International Conference on Big Data (BigData)","start":{"date-parts":[[2023,12,15]]},"location":"Sorrento, Italy","end":{"date-parts":[[2023,12,18]]}},"container-title":["2023 IEEE International Conference on Big Data (BigData)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10385234\/10386078\/10386849.pdf?arnumber=10386849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:26:44Z","timestamp":1706754404000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10386849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,15]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/bigdata59044.2023.10386849","relation":{},"subject":[],"published":{"date-parts":[[2023,12,15]]}}}