{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,18]],"date-time":"2025-01-18T05:07:54Z","timestamp":1737176874964,"version":"3.33.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,12,15]],"date-time":"2024-12-15T00:00:00Z","timestamp":1734220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,15]],"date-time":"2024-12-15T00:00:00Z","timestamp":1734220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,12,15]]},"DOI":"10.1109\/bigdata62323.2024.10826031","type":"proceedings-article","created":{"date-parts":[[2025,1,16]],"date-time":"2025-01-16T18:31:23Z","timestamp":1737052283000},"page":"104-109","source":"Crossref","is-referenced-by-count":0,"title":["Scalable Sampling for High Utility Patterns"],"prefix":"10.1109","author":[{"given":"Lamine","family":"Diop","sequence":"first","affiliation":[{"name":"Le Kremlin-Bicetre,EPITA Research Laboratory (LRE),Paris,France,FR-94276"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marc","family":"Plantevit","sequence":"additional","affiliation":[{"name":"Le Kremlin-Bicetre,EPITA Research Laboratory (LRE),Paris,France,FR-94276"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00778-021-00704-2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3588443"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3448016.3457267"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v37i6.25929"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-43968-5_9"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3447548.3467344"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.14778\/1687627.1687710"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2020408.2020500"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2018.00024"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-05936-0_11"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/math11040950"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611972740.51"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2016.04.002"}],"event":{"name":"2024 IEEE International Conference on Big Data (BigData)","start":{"date-parts":[[2024,12,15]]},"location":"Washington, DC, USA","end":{"date-parts":[[2024,12,18]]}},"container-title":["2024 IEEE International Conference on Big Data (BigData)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10824975\/10824942\/10826031.pdf?arnumber=10826031","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,17]],"date-time":"2025-01-17T08:10:48Z","timestamp":1737101448000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10826031\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,15]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/bigdata62323.2024.10826031","relation":{},"subject":[],"published":{"date-parts":[[2024,12,15]]}}}