{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:36:49Z","timestamp":1781887009166,"version":"3.54.5"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/biocas.2012.6418469","type":"proceedings-article","created":{"date-parts":[[2013,1,30]],"date-time":"2013-01-30T22:50:49Z","timestamp":1359586249000},"page":"172-175","source":"Crossref","is-referenced-by-count":4,"title":["ISFET's threshold voltage control using bidirectional electron tunnelling"],"prefix":"10.1109","author":[{"given":"Abdulrahman","family":"Al-Ahdal","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"P.","family":"Georgiou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C.","family":"Toumazou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.916680"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1049\/el:20082268"},{"key":"10","article-title":"A review of gate tunneling current in mos devices","author":"juan","year":"2006","journal-title":"Microelectronics Reliability"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(02)00301-5"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1049\/el.2011.3057"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1049\/el.2009.2310"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5536954"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1991.235276"},{"key":"9","author":"bradley","year":"1999","journal-title":"Autozeroing Floating-Gate Amplifier"},{"key":"8","author":"sze","year":"2007","journal-title":"Physics of Semiconductor Devices"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541858"},{"key":"12","article-title":"0:35-m cmos c35 process parameters","year":"2008","journal-title":"Austriamicrosystems Tech Rep"}],"event":{"name":"2012 IEEE Biomedical Circuits and Systems Conference (BioCAS 2012)","location":"Hsinchu","start":{"date-parts":[[2012,11,28]]},"end":{"date-parts":[[2012,11,30]]}},"container-title":["2012 IEEE Biomedical Circuits and Systems Conference (BioCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6410528\/6418223\/06418469.pdf?arnumber=6418469","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T20:37:57Z","timestamp":1490128677000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6418469\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/biocas.2012.6418469","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}