{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T02:01:14Z","timestamp":1740103274535,"version":"3.37.3"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,8,28]],"date-time":"2024-08-28T00:00:00Z","timestamp":1724803200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,28]],"date-time":"2024-08-28T00:00:00Z","timestamp":1724803200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020487","name":"Nature","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100020487","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,8,28]]},"DOI":"10.1109\/case59546.2024.10711757","type":"proceedings-article","created":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:40:16Z","timestamp":1729705216000},"page":"2314-2319","source":"Crossref","is-referenced-by-count":0,"title":["A MPC Performance Degradation Diagnosis Method Based on Receding Feature Horizon"],"prefix":"10.1109","author":[{"given":"Wenhua","family":"Jiao","sequence":"first","affiliation":[{"name":"Nanjing Tech University,College of Electrical Engineering and Control Science,Nanjing,China,211816"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Taotao","family":"Zou","sequence":"additional","affiliation":[{"name":"Nanjing Tech University,College of Electrical Engineering and Control Science,Nanjing,China,211816"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhangcheng","family":"Xie","sequence":"additional","affiliation":[{"name":"Nanjing Tech University,College of Electrical Engineering and Control Science,Nanjing,China,211816"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shipin","family":"Yang","sequence":"additional","affiliation":[{"name":"Nanjing Tech University,College of Electrical Engineering and Control Science,Nanjing,China,211816"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yining","family":"Dong","sequence":"additional","affiliation":[{"name":"City University of HongKong,School of Date Science,HongKong,China,114173"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijuan","family":"Li","sequence":"additional","affiliation":[{"name":"Nanjing Tech University,College of Electrical Engineering and Control Science,Nanjing,China,211816"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/S0967-0661(02)00186-7"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.conengprac.2005.11.005"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.jprocont.2003.07.003"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.neucom.2010.09.018"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.jprocont.2009.09.003"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.isatra.2020.06.021"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.jprocont.2017.06.008"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1002\/acs.3206"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TASLP.2020.3039600"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1016\/j.conengprac.2020.104458"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.isatra.2018.10.032"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.aei.2023.101971"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/0005-1098(89)90002-2"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/S0098-1354(98)00301-9"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.conengprac.2021.105006"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TNNLS.2014.2382123"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.isatra.2021.01.060"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.aei.2021.101480"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.conengprac.2021.104969"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1016\/j.conengprac.2020.104673"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.aei.2020.101184"}],"event":{"name":"2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)","start":{"date-parts":[[2024,8,28]]},"location":"Bari, Italy","end":{"date-parts":[[2024,9,1]]}},"container-title":["2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10711304\/10711288\/10711757.pdf?arnumber=10711757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T01:30:43Z","timestamp":1732671043000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10711757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8,28]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/case59546.2024.10711757","relation":{},"subject":[],"published":{"date-parts":[[2024,8,28]]}}}