{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:38:59Z","timestamp":1725701939052},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,9,20]],"date-time":"2020-09-20T00:00:00Z","timestamp":1600560000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,20]],"date-time":"2020-09-20T00:00:00Z","timestamp":1600560000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,20]],"date-time":"2020-09-20T00:00:00Z","timestamp":1600560000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9,20]]},"DOI":"10.1109\/cases51649.2020.9243711","type":"proceedings-article","created":{"date-parts":[[2020,11,4]],"date-time":"2020-11-04T21:03:38Z","timestamp":1604523818000},"page":"1-3","source":"Crossref","is-referenced-by-count":1,"title":["Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management: Work-in-Progress"],"prefix":"10.1109","author":[{"given":"Shuyuan","family":"Yu","sequence":"first","affiliation":[]},{"given":"Han","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Shaoyi","family":"Peng","sequence":"additional","affiliation":[]},{"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[]},{"given":"Joerg","family":"Henkel","sequence":"additional","affiliation":[]},{"given":"Sheldon X.-D.","family":"Tan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.08.009"},{"journal-title":"VLSI Systems Long-Term Reliability - Modeling Simulation and Optimization","year":"2019","author":"tan","key":"ref3"},{"journal-title":"Degradation-Aware Cell Libraries V1 0","year":"0","key":"ref6"},{"journal-title":"International Sematech Technology Transfer Document 03024377A-TR","article-title":"Critical Reliability Challenges for The International Technology Roadmap for Semiconductors (ITRS)","year":"2003","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045546"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062331"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062290"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2778107"}],"event":{"name":"2020 International Conference on Compilers, Architecture, and Synthesis for Embedded Systems (CASES)","start":{"date-parts":[[2020,9,20]]},"location":"Shanghai, China","end":{"date-parts":[[2020,9,25]]}},"container-title":["2020 International Conference on Compilers, Architecture, and Synthesis for Embedded Systems (CASES)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9243670\/9243710\/09243711.pdf?arnumber=9243711","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:39:42Z","timestamp":1656344382000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9243711\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9,20]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/cases51649.2020.9243711","relation":{},"subject":[],"published":{"date-parts":[[2020,9,20]]}}}