{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T23:21:10Z","timestamp":1774048870014,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2009,7,1]],"date-time":"2009-07-01T00:00:00Z","timestamp":1246406400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2009,7,1]],"date-time":"2009-07-01T00:00:00Z","timestamp":1246406400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,7]]},"DOI":"10.1109\/cca.2009.5281046","type":"proceedings-article","created":{"date-parts":[[2009,10,12]],"date-time":"2009-10-12T15:41:39Z","timestamp":1255362099000},"page":"1271-1275","source":"Crossref","is-referenced-by-count":7,"title":["Automatic tuning of PI controller for atomic force microscope based on relay with hysteresis"],"prefix":"10.1109","author":[{"given":"Xianwei","family":"Zhou","sequence":"first","affiliation":[{"name":"Institute of Robot, Nankai University, Tianjin, China"}]},{"given":"Xiaokun","family":"Dong","sequence":"additional","affiliation":[{"name":"Institute of Robot, Nankai University, Tianjin, China"}]},{"given":"Yudong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Robot, Nankai University, Tianjin, China"}]},{"given":"Yongchun","family":"Fang","sequence":"additional","affiliation":[{"name":"Institute of Robot, Nankai University, Tianjin, China"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"crossref","first-page":"328","DOI":"10.1049\/ip-d.1993.0044","article-title":"pid autotuning algorithm based on relay feedback","volume":"140","author":"leva","year":"1993","journal-title":"Control Theory and Applications IEE Proceedings D [see also IEE Proceedings-Control Theory and Applications]"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2000.972334"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2005.847331"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(84)90014-1"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1063\/1.2964119"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2008.917859"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.75.949"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2008.4586898"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1063\/1.2999579"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2008.4586899"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2008.4586983"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1903123"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2008.4586984"},{"key":"8","first-page":"3488","article-title":"A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force Microscopes","author":"abramovitch","year":"2007","journal-title":"American Control Conference"}],"event":{"name":"2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC)","location":"St. Petersburg, Russia","start":{"date-parts":[[2009,7,8]]},"end":{"date-parts":[[2009,7,10]]}},"container-title":["2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5268173\/5280693\/05281046.pdf?arnumber=5281046","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T22:45:00Z","timestamp":1774046700000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5281046\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,7]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/cca.2009.5281046","relation":{},"subject":[],"published":{"date-parts":[[2009,7]]}}}