{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:14:25Z","timestamp":1740100465105,"version":"3.37.3"},"reference-count":38,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,11,10]],"date-time":"2021-11-10T00:00:00Z","timestamp":1636502400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,11,10]],"date-time":"2021-11-10T00:00:00Z","timestamp":1636502400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003141","name":"Consejo Nacional de Ciencia y Tecnolog\u00eda (CONACYT)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003141","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,11,10]]},"DOI":"10.1109\/cce53527.2021.9632880","type":"proceedings-article","created":{"date-parts":[[2021,12,14]],"date-time":"2021-12-14T20:45:53Z","timestamp":1639514753000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Bandgap dependence on facet and size engineering of TiO<sub>2<\/sub>: A DFT Study"],"prefix":"10.1109","author":[{"given":"Francisco","family":"Javier-Cano","sequence":"first","affiliation":[{"name":"Nanosciences and Nanotechnology Program, CINVESTAV-IPN,Ciudad de M&#x00E9;xico,M&#x00E9;xico"}]},{"given":"Araceli","family":"Romero-Nunez","sequence":"additional","affiliation":[{"name":"CINVESTAV-IPN,Department of Electrical Engineering (SEES),Ciudad de M&#x00E9;xico,M&#x00E9;xico"}]},{"given":"Anish","family":"Jantrania","sequence":"additional","affiliation":[{"name":"TEXAS A &#x0026; M UNIVERSITY,Department of Biological and Agricultural Engineering,Texas,USA"}]},{"given":"Hongbo","family":"Liu","sequence":"additional","affiliation":[{"name":"Instituto Mexicano del Petr&#x00F3;leo,Ciudad de M&#x00E9;xico,M&#x00E9;xico"}]},{"given":"A.","family":"Kassiba","sequence":"additional","affiliation":[{"name":"Institute of Molecular and Materials, Le Mans University,Le Mans,France"}]},{"given":"S.","family":"Velumani","sequence":"additional","affiliation":[{"name":"CINVESTAV-IPN,Department of Electrical Engineering (SEES),Ciudad de M&#x00E9;xico,M&#x00E9;xico"}]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1021\/jz3000646"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1021\/am302631b"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1039\/C5RA00344J"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1039\/c1cc10665a"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1021\/ja808790p"},{"journal-title":"Quantification of rutile in anatase by means of X-ray diffraction technique","year":"0","author":"macias","key":"ref37"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1021\/ef801091p"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1021\/cm7024203"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.63.155409"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.apcatb.2016.05.017"},{"year":"0","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-5729(02)00100-0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.76.235307"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(94)00851-5"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/catal3010036"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/marc.200700345"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.51.6842"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.50.101103"},{"journal-title":"S&#x00ED;ntese solvot&#x00E9;rmica de TiO2 e an&#x00E1;lise da atividade fotocatalitica","year":"2017","author":"rocha","key":"ref19"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1039\/c0cc05798c"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1039\/c3nr04655a"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1039\/c1jm00068c"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.watres.2010.12.019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1039\/C5RA04259C"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/catal3020455"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/jp204364a"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2021.150360"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apcata.2021.118250"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/cr500072j"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jhazmat.2021.126112"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.msec.2015.10.042"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3989\/mc.2010.48408"},{"journal-title":"Applied Physics","year":"2010","author":"muktavat","key":"ref22"},{"journal-title":"Introduction to Crystallography","year":"1993","author":"sands","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1021\/nn305877v"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s00214-006-0191-4"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1039\/c1cc13034j"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/nl901181n"}],"event":{"name":"2021 18th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","start":{"date-parts":[[2021,11,10]]},"location":"Mexico City, Mexico","end":{"date-parts":[[2021,11,12]]}},"container-title":["2021 18th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9632874\/9632875\/09632880.pdf?arnumber=9632880","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:49:21Z","timestamp":1659484161000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9632880\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,10]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/cce53527.2021.9632880","relation":{},"subject":[],"published":{"date-parts":[[2021,11,10]]}}}