{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T12:45:41Z","timestamp":1725713141972},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T00:00:00Z","timestamp":1698192000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T00:00:00Z","timestamp":1698192000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,25]]},"DOI":"10.1109\/cce60043.2023.10332877","type":"proceedings-article","created":{"date-parts":[[2023,12,5]],"date-time":"2023-12-05T18:18:35Z","timestamp":1701800315000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Decision Tree Learning Enhancement for Dynamic Data with Disturbances and Uncertainties via Integration of DWT and Nonlinear SVM"],"prefix":"10.1109","author":[{"given":"Zhengmao","family":"Ye","sequence":"first","affiliation":[{"name":"Southern University,College of Science and Engineering,Baton Rouge,USA"}]},{"given":"Hang","family":"Yin","sequence":"additional","affiliation":[{"name":"Southern University,College of Science and Engineering,Baton Rouge,USA"}]}],"member":"263","reference":[{"volume-title":"Digital Image Processing","year":"2007","author":"Gonzalez","key":"ref1"},{"volume-title":"Neural Networks","year":"1999","author":"Haykin","key":"ref2"},{"article-title":"Computerized Examination of Cylinder Pressure Rise and Heat Release Analysis for Rapid Compression Machine","volume-title":"Proceedings of 2006 BSME-ASME International Conference on Thermal Engineering","author":"Ye","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ijcnn.2003.1223435"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2004.840071"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/jrs.885"},{"key":"ref7","first-page":"882","article-title":"DWT Analysis of Selected Transient and Notching Disturbances","volume-title":"World Congress Fundamental and Applied Metrology","author":"Szweda"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2010.2041777"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2006.880628"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2007.4341670"},{"volume-title":"Proceedings of the 2012 IEEE International Conference on Computer Science and Engineering","key":"ref11","first-page":"1173"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ihsh51661.2021.9378707"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EPE56121.2022.9959857"}],"event":{"name":"2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","start":{"date-parts":[[2023,10,25]]},"location":"Mexico City, Mexico","end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10332458\/10332802\/10332877.pdf?arnumber=10332877","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,6]],"date-time":"2024-02-06T18:42:25Z","timestamp":1707244945000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10332877\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,25]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/cce60043.2023.10332877","relation":{},"subject":[],"published":{"date-parts":[[2023,10,25]]}}}