{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T12:48:21Z","timestamp":1725713301281},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T00:00:00Z","timestamp":1698192000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T00:00:00Z","timestamp":1698192000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,25]]},"DOI":"10.1109\/cce60043.2023.10332892","type":"proceedings-article","created":{"date-parts":[[2023,12,5]],"date-time":"2023-12-05T18:18:35Z","timestamp":1701800315000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Performance assessment of a new optimized Junctionless SiSn MOSFET"],"prefix":"10.1109","author":[{"given":"H.","family":"Ferhati","sequence":"first","affiliation":[{"name":"ISTA University of Larbi Ben M’hidi,Oum El Bouaghi,Oum El Bouaghi,Algeria"}]},{"given":"K.","family":"Kacha","sequence":"additional","affiliation":[{"name":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria,05000"}]},{"given":"R.","family":"Labchek","sequence":"additional","affiliation":[{"name":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria,05000"}]},{"given":"K.","family":"Dibi","sequence":"additional","affiliation":[{"name":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria,05000"}]},{"given":"F.","family":"Djeffal","sequence":"additional","affiliation":[{"name":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria,05000"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1515\/ntrev-2017-0155"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2914193"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/20\/2\/010"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3279306"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/33\/1\/014001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2012.04.072"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9071174"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2010.15"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/33\/1\/014001"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2022.108567"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/9781119523543.ch4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-323-91832-9.00002-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2925597"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1052-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3287880"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.2403903"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/ome.398958"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.201308300"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4929801"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2012.10.017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2017.06.002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.spmi.2015.09.041"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/4235.985692"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3906\/elk-0907-132"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DEVIC.2019.8783730"}],"event":{"name":"2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","start":{"date-parts":[[2023,10,25]]},"location":"Mexico City, Mexico","end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10332458\/10332802\/10332892.pdf?arnumber=10332892","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,6]],"date-time":"2024-02-06T18:42:10Z","timestamp":1707244930000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10332892\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,25]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/cce60043.2023.10332892","relation":{},"subject":[],"published":{"date-parts":[[2023,10,25]]}}}