{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T13:50:19Z","timestamp":1762005019518,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/ccece.2018.8447812","type":"proceedings-article","created":{"date-parts":[[2018,8,30]],"date-time":"2018-08-30T21:54:56Z","timestamp":1535666096000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Metallographic Specimen Imaging Classification: A Machine Learning Approach"],"prefix":"10.1109","author":[{"given":"Fabrizzio Alphonsus A.M.N.","family":"Soares","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manoel I.","family":"Queiroz Junior","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rogerio","family":"Salvini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"125","author":"shackelford","year":"2005","journal-title":"Introduction to Materials Science for Engineers"},{"key":"ref3","first-page":"5","article-title":"The true microstructure of materials","author":"geels","year":"2000","journal-title":"Structure - Struers Journal of Materialography"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1973.4309314"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s40194-016-0318-8"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.827257"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1766507"},{"key":"ref12","first-page":"2825","article-title":"Scikit-learn: Machine learning in python","volume":"12","author":"pedregosa","year":"2011","journal-title":"Journal of Machine Learning Research"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2017.05.014"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.commatsci.2015.08.011"},{"key":"ref2","article-title":"E3-11: Standard guide for preparation of metallographic specimens","author":"standard","year":"2012","journal-title":"ASTM International West Conshohocken PA"},{"key":"ref9","first-page":"48109","article-title":"Comparing image classification methods: K-nearest-neighbor and support-vector-machines","volume":"1001","author":"kim","year":"2012","journal-title":"Ann Arbor"},{"key":"ref1","article-title":"E112: Standard test methods for determining average grain size","author":"standard","year":"1996","journal-title":"ASTM International West Conshohocken PA"}],"event":{"name":"2018 IEEE 31st Canadian Conference on Electrical & Computer Engineering (CCECE)","start":{"date-parts":[[2018,5,13]]},"location":"Quebec City, QC","end":{"date-parts":[[2018,5,16]]}},"container-title":["2018 IEEE Canadian Conference on Electrical & Computer Engineering (CCECE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8426058\/8447529\/08447812.pdf?arnumber=8447812","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T16:51:01Z","timestamp":1643215861000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8447812\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ccece.2018.8447812","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}