{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:22:12Z","timestamp":1729628532050,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/ccis.2011.6045060","type":"proceedings-article","created":{"date-parts":[[2011,10,13]],"date-time":"2011-10-13T16:57:09Z","timestamp":1318525029000},"page":"198-203","source":"Crossref","is-referenced-by-count":0,"title":["Detecting and diagnosing application misbehaviors in ‘on-demand’ virtual computing infrastructures"],"prefix":"10.1109","author":[{"given":"M C","family":"Ramya","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sumit Kumar","family":"Bose","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Salsburg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Venkat","family":"Shivaram","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shrisha","family":"Rao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"Statistics for Management","author":"levin","year":"1997","journal-title":"7th ed Pearson"},{"journal-title":"[Online] Available","article-title":"Integrien","year":"2011","key":"ref3"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1016\/S0098-1354(02)00161-8","article-title":"A review of process fault detection and diagnosis Part II: Qualitative models and search strategies","volume":"27","author":"venkatasubramanian","year":"0","journal-title":"Computers and Chemical Engineering"},{"key":"ref6","first-page":"369","article-title":"A Practical Approach for Interpreting Multivariate T2 Control Chart Signals","volume":"29","author":"mason","year":"1997"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1016\/S0098-1354(02)00162-X","article-title":"A review of process fault detection and diagnosis Part III: Process history based methods","volume":"27","author":"venkatasubramanian","year":"0","journal-title":"Computers and Chemical Engineering"},{"key":"ref5","first-page":"131","article-title":"Improving the Sensitivity of the T2 Statistic in Multivariate Process Control","volume":"31","author":"mason","year":"0","journal-title":"Journal of Quality Technology"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2307\/2532560"},{"key":"ref7","first-page":"99","article-title":"Decomposition of T2 for Multivariate Control Chart Interpretation","volume":"27","author":"mason","year":"1995"},{"journal-title":"[Online] Available","article-title":"Appdynamics","year":"2011","key":"ref2"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1016\/S0098-1354(02)00160-6","article-title":"A review of process fault detection and diagnosis Part I: Quantitative model-based methods","volume":"27","author":"venkatasubramanian","year":"0","journal-title":"Computers and Chemical Engineering"},{"journal-title":"[Online] Available","article-title":"Netuitive","year":"2011","key":"ref1"}],"event":{"name":"2011 IEEE International Conference on Cloud Computing and Intelligence Systems (CCIS)","start":{"date-parts":[[2011,9,15]]},"location":"Beijing, China","end":{"date-parts":[[2011,9,17]]}},"container-title":["2011 IEEE International Conference on Cloud Computing and Intelligence Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6034549\/6045020\/06045060.pdf?arnumber=6045060","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T03:55:43Z","timestamp":1497930943000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6045060\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ccis.2011.6045060","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}