{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T00:20:04Z","timestamp":1770337204636,"version":"3.49.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T00:00:00Z","timestamp":1736467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T00:00:00Z","timestamp":1736467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,1,10]]},"DOI":"10.1109\/ccnc54725.2025.10976149","type":"proceedings-article","created":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T17:52:06Z","timestamp":1746467526000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["WIP: Cyber Security Measurement Taking Physical Circumstances"],"prefix":"10.1109","author":[{"given":"Masataka","family":"Nakahara","sequence":"first","affiliation":[{"name":"KDDI Research, Inc.,Saitama,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Keizo","family":"Sugiyama","sequence":"additional","affiliation":[{"name":"KDDI Research, Inc.,Saitama,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Norihiro","family":"Okui","sequence":"additional","affiliation":[{"name":"KDDI Research, Inc.,Saitama,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yasuaki","family":"Kobayashi","sequence":"additional","affiliation":[{"name":"KDDI Research, Inc.,Saitama,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ayumu","family":"Kubota","sequence":"additional","affiliation":[{"name":"KDDI Research, Inc.,Saitama,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shinsaku","family":"Kiyomoto","sequence":"additional","affiliation":[{"name":"KDDI Research, Inc.,Saitama,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.5555\/3277203.3277206"},{"key":"ref2","first-page":"1","article-title":"Digital twin: manufacturing excellence through virtual factory replication","volume":"1","author":"Grieves","year":"2014","journal-title":"White paper"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MSEC.2023.3271225"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657085"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0001-6"}],"event":{"name":"2025 IEEE 22nd Consumer Communications &amp; Networking Conference (CCNC)","location":"Las Vegas, NV, USA","start":{"date-parts":[[2025,1,10]]},"end":{"date-parts":[[2025,1,13]]}},"container-title":["2025 IEEE 22nd Consumer Communications &amp;amp; Networking Conference (CCNC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10975854\/10975830\/10976149.pdf?arnumber=10976149","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,6]],"date-time":"2025-05-06T04:51:12Z","timestamp":1746507072000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10976149\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/ccnc54725.2025.10976149","relation":{},"subject":[],"published":{"date-parts":[[2025,1,10]]}}}