{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:58:58Z","timestamp":1725706738530},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/ccta.2017.8062668","type":"proceedings-article","created":{"date-parts":[[2017,10,24]],"date-time":"2017-10-24T16:33:56Z","timestamp":1508862836000},"page":"1486-1491","source":"Crossref","is-referenced-by-count":1,"title":["Pairwise discriminate analysis based minimax probability machine (PDA-MPM) approach for fault diagnosis"],"prefix":"10.1109","author":[{"given":"Benben","family":"Jiang","sequence":"first","affiliation":[]},{"given":"Zhifeng","family":"Guo","sequence":"additional","affiliation":[]},{"given":"Qunxiong","family":"Zhu","sequence":"additional","affiliation":[]},{"given":"Gao","family":"Huang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2014.2365699"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(99)00061-1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2016.09.001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0347-9"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.02.004"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1162\/153244303321897726"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2016.2563395"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2006.872819"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2013.2285783"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2014.12.001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2015.03.001"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.10.030"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690420412"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2003.10.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2481318"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.05.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/cem.785"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-4381-7_16"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(94)00057-U"},{"journal-title":"Gram-Schmidt Process","year":"2014","author":"dukes","key":"ref21"}],"event":{"name":"2017 IEEE Conference on Control Technology and Applications (CCTA)","start":{"date-parts":[[2017,8,27]]},"location":"Mauna Lani Resort, HI, USA","end":{"date-parts":[[2017,8,30]]}},"container-title":["2017 IEEE Conference on Control Technology and Applications (CCTA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8052581\/8062426\/08062668.pdf?arnumber=8062668","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T23:26:31Z","timestamp":1509146791000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8062668\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/ccta.2017.8062668","relation":{},"subject":[],"published":{"date-parts":[[2017,8]]}}}