{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T17:27:45Z","timestamp":1782408465626,"version":"3.54.5"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,13]],"date-time":"2023-12-13T00:00:00Z","timestamp":1702425600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,13]],"date-time":"2023-12-13T00:00:00Z","timestamp":1702425600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303090,U2230206"],"award-info":[{"award-number":["62303090,U2230206"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,13]]},"DOI":"10.1109\/cdc49753.2023.10383340","type":"proceedings-article","created":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:38:36Z","timestamp":1705689516000},"page":"4867-4872","source":"Crossref","is-referenced-by-count":1,"title":["Incipient Fault Detection with Feature Ensemble Based on One-Class Machine Learning Methods"],"prefix":"10.1109","author":[{"given":"Min","family":"Wang","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China,611731"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Feiyang","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China,611731"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China,611731"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jinhua","family":"Mi","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China,611731"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhiwei","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Control Science and Engineering, Shandong University,Jinan,China,250061"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gen","family":"Qiu","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China,611731"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/s0098-1354(02)00160-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110670"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2022.3228524"},{"key":"ref4","first-page":"750","article-title":"Fault detection methods: A literature survey","volume-title":"2011 Proc. 34th Int. Conv. MIPRO","author":"Miljkovi","year":"2011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3157927"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2016.2532381"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3167838"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2019.2930805"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3151072"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2003.09.004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3092627"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/machines10040249"},{"issue":"3","key":"ref16","first-page":"582","article-title":"Support vector method for novelty detection","volume":"12","author":"Scholkopf","year":"2000","journal-title":"Advances in neural information processing systems"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2133360.2133363"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-9326-7"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2015.01.006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3150805"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2759301"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-30223-7_87"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2012.12.020"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/ng.3477"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"}],"event":{"name":"2023 62nd IEEE Conference on Decision and Control (CDC)","location":"Singapore, Singapore","start":{"date-parts":[[2023,12,13]]},"end":{"date-parts":[[2023,12,15]]}},"container-title":["2023 62nd IEEE Conference on Decision and Control (CDC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10383192\/10383193\/10383340.pdf?arnumber=10383340","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,23]],"date-time":"2024-01-23T16:41:34Z","timestamp":1706028094000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10383340\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,13]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/cdc49753.2023.10383340","relation":{},"subject":[],"published":{"date-parts":[[2023,12,13]]}}}