{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:50:22Z","timestamp":1725706222019},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,13]],"date-time":"2023-12-13T00:00:00Z","timestamp":1702425600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,13]],"date-time":"2023-12-13T00:00:00Z","timestamp":1702425600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007187","name":"MIT Lincoln Laboratory","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007187","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["IIS-2024606,GCR 2219101"],"award-info":[{"award-number":["IIS-2024606,GCR 2219101"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007161","name":"Boston University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007161","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,13]]},"DOI":"10.1109\/cdc49753.2023.10383712","type":"proceedings-article","created":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:38:36Z","timestamp":1705689516000},"page":"6841-6846","source":"Crossref","is-referenced-by-count":0,"title":["Robustness Measures and Monitors for Time Window Temporal Logic"],"prefix":"10.1109","author":[{"given":"Ahmad","family":"Ahmad","sequence":"first","affiliation":[{"name":"Boston University,Division of System Engineering,Boston,MA,USA,02215"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristian-Ioan","family":"Vasile","sequence":"additional","affiliation":[{"name":"Lehigh University,Mechanical Engineering and Mechanics Department,Bethlehem,PA,USA,18015"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roberto","family":"Tron","sequence":"additional","affiliation":[{"name":"Boston University,Division of System Engineering,Boston,MA,USA,02215"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Calin","family":"Belta","sequence":"additional","affiliation":[{"name":"Boston University,Division of System Engineering,Boston,MA,USA,02215"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"Principles of model checking","year":"2008","author":"Baier","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.1977.32"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3233\/AIC-150682"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-control-060117-104838"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2021.3061983"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1177\/0278364920913922"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-50763-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2017.8206234"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2021.3064220"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1177\/0278364911406761"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.15607\/rss.2021.xvii.090"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1177\/0278364920918919"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-30206-3_12"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/BF01995674"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.tcs.2017.07.012"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15297-9_9"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.tcs.2009.06.021"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2016.7799279"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ALLERTON.2015.7447084"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2017.8206235"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1177\/02783649221082115"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2020.12.2397"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CDC45484.2021.9683477"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.2019.8814487"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-43089-4_9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10703-017-0286-7"},{"key":"ref27","article-title":"Robustness measures and monitors for time window temporal logic","author":"Ahmad","year":"2023","journal-title":"arXiv preprint"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-75632-5_5"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2022.3160592"}],"event":{"name":"2023 62nd IEEE Conference on Decision and Control (CDC)","start":{"date-parts":[[2023,12,13]]},"location":"Singapore, Singapore","end":{"date-parts":[[2023,12,15]]}},"container-title":["2023 62nd IEEE Conference on Decision and Control (CDC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10383192\/10383193\/10383712.pdf?arnumber=10383712","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,23]],"date-time":"2024-01-23T16:58:19Z","timestamp":1706029099000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10383712\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,13]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/cdc49753.2023.10383712","relation":{},"subject":[],"published":{"date-parts":[[2023,12,13]]}}}