{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,19]],"date-time":"2024-12-19T05:29:36Z","timestamp":1734586176402,"version":"3.30.2"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/cec.2004.1330968","type":"proceedings-article","created":{"date-parts":[[2004,9,28]],"date-time":"2004-09-28T13:50:22Z","timestamp":1096379422000},"page":"978-985","source":"Crossref","is-referenced-by-count":3,"title":["Evolving neural networks using swarm intelligence for binmap classification"],"prefix":"10.1109","author":[{"given":"E.","family":"Miguelanez","sequence":"first","affiliation":[]},{"given":"A.M.S.","family":"Zalzala","sequence":"additional","affiliation":[]},{"given":"P.","family":"Tabor","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMC.2000.884366"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.1999.785508"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.1997.632235"},{"key":"15","first-page":"69","article-title":"A modified particle swarm optimizer","author":"shi","year":"1999","journal-title":"Proc of Int Joint Conf on Neural Networks"},{"journal-title":"Swarm Intelligence","year":"2001","author":"kennedy","key":"16"},{"journal-title":"Neural Networks A Comprehensive Foundation","year":"1994","author":"haykin","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/MHS.1995.494215"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(98)00051-3"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/5.58326"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2001.939004"},{"key":"20","first-page":"84","article-title":"Cooperative learning in neural networks using particle swarm optimizers","author":"van den bergh","year":"2000","journal-title":"South African Computer Journal"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.2003.1299752"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1962.1057692"},{"key":"24","first-page":"115","author":"papoulis","year":"1991","journal-title":"Probability Random Variables and Stochastic Processes 3rd ed"},{"key":"25","article-title":"Parameter selection in particle swarm optimization","author":"shi","year":"0","journal-title":"Proc 1998 Annu Conf Evolutionary Programming"},{"key":"26","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1111\/j.2517-6161.1974.tb00994.x","article-title":"Cross-validatory choice and assessment of statistical predictions","volume":"36","author":"stone","year":"1974","journal-title":"Journal of the Royal Statistical Society"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/4235.887237"},{"key":"28","first-page":"84","article-title":"Comparing inertia weight and constriction factors in particle swarm optimization","author":"eberhart","year":"2000","journal-title":"Proc of the Congress of Evolutionary Computation"},{"journal-title":"The National Technology Roadmap for Semiconductors","year":"2001","key":"3"},{"key":"2","article-title":"Automated analysis for rapid defect sourcing and yield learning","volume":"4","author":"tobin","year":"1997","journal-title":"Future Fab International"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.1993.342415"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.884600"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1038\/343263a0"},{"key":"6","first-page":"321","article-title":"Multivariable functional interpolation and adaptive networks","volume":"2","author":"broomhead","year":"1988","journal-title":"Complex Systems"},{"key":"5","doi-asserted-by":"crossref","first-page":"210","DOI":"10.1117\/12.209203","article-title":"Automatic defect classification: Status and industry trends","volume":"2439","author":"bennett","year":"1995","journal-title":"Proc Integr Circ Metrology Inspection Process Contr IX"},{"key":"4","doi-asserted-by":"crossref","DOI":"10.1117\/12.350840","article-title":"The application of spatial signature analysis to electrical test data: Validation study","author":"karnowski","year":"1999","journal-title":"SPIE's 24th Annual International Symposium on Metrology Inspection and Process Control for Microlithography XIII"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1989.1.2.281"},{"key":"8","first-page":"970","article-title":"Practical characteristics of neural network and conventional pattern classifiers","volume":"3","author":"ng","year":"1991","journal-title":"Advanced in Neural Information Processing Systems"}],"event":{"name":"Proceedings of the 2004 Congress on Evolutionary Computation","acronym":"CEC-04","location":"Portland, OR, USA"},"container-title":["Proceedings of the 2004 Congress on Evolutionary Computation (IEEE Cat. No.04TH8753)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9256\/29383\/01330968.pdf?arnumber=1330968","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,18]],"date-time":"2024-12-18T19:20:38Z","timestamp":1734549638000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1330968\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/cec.2004.1330968","relation":{},"subject":[]}}