{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T13:03:53Z","timestamp":1772024633746,"version":"3.50.1"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,5]]},"DOI":"10.1109\/cec.2009.4983132","type":"proceedings-article","created":{"date-parts":[[2009,10,14]],"date-time":"2009-10-14T20:17:46Z","timestamp":1255551466000},"page":"1591-1598","source":"Crossref","is-referenced-by-count":10,"title":["Towards evolving industry-feasible intrinsic variability tolerant CMOS designs"],"prefix":"10.1109","author":[{"given":"James Alfred","family":"Walker","sequence":"first","affiliation":[]},{"given":"James A.","family":"Hilder","sequence":"additional","affiliation":[]},{"given":"Andy M.","family":"Tyrrell","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9317(99)00348-2"},{"key":"22","article-title":"optimising intrinsic variability tolerant standard cell libraries","author":"hilder","year":"2009","journal-title":"Proc IEEE CEC"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1145\/1276958.1277276"},{"key":"18","article-title":"design for manufacturability: opc and stress variations","author":"moroz","year":"2007","journal-title":"International Conference on CMOS Variability"},{"key":"24","author":"petley","year":"0","journal-title":"VLSI and ASIC Technology Standard Cell Library Design"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/10\/2\/309"},{"key":"16","article-title":"variability in the next generation cmos technologies and impact on design","year":"2007","journal-title":"International Conference of CMOS Variability"},{"key":"13","author":"streetman","year":"2000","journal-title":"Solid State Electronic Devices"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-583X(01)00908-9"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85857-7_2"},{"key":"12","first-page":"308","article-title":"evolving variability-tolerant cmos designs","author":"walker","year":"2008","journal-title":"Proc of ICES"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"3","article-title":"analog circuit design using genetic algorithms","author":"noren","year":"2001","journal-title":"2nd Online Symposium for Electronic Engineers"},{"key":"20","article-title":"cartesian genetic programming","author":"miller","year":"2000","journal-title":"Proc of EuroGP"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2007.4337663"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.1998.658762"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2006.10.001"},{"key":"7","article-title":"automated analog circuit sythesis using a linear representation","author":"lohn","year":"1998","journal-title":"Proc of ICES"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/SSMSD.2003.1190386"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1147\/rd.504.0433"},{"key":"4","article-title":"power dissipation reductions with genetic algortihms","author":"takahashi","year":"2005","journal-title":"Proc of NASA\/DOD EH"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1007\/0-387-23254-0_8"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804109"}],"event":{"name":"2009 IEEE Congress on Evolutionary Computation (CEC)","location":"Trondheim, Norway","start":{"date-parts":[[2009,5,18]]},"end":{"date-parts":[[2009,5,21]]}},"container-title":["2009 IEEE Congress on Evolutionary Computation"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4939002\/4982922\/04983132.pdf?arnumber=4983132","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T16:17:41Z","timestamp":1602692261000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4983132"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,5]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/cec.2009.4983132","relation":{},"subject":[],"published":{"date-parts":[[2009,5]]}}}