{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:49:15Z","timestamp":1725504555488},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/cicc.2002.1012811","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T17:52:33Z","timestamp":1056563553000},"page":"269-272","source":"Crossref","is-referenced-by-count":1,"title":["SOI Hall effect sensor operating up to 270\u00b0C"],"prefix":"10.1109","author":[{"given":"L.","family":"Portmann","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Ballan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Declercq","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.585275"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/41.915405"}],"event":{"name":"IEEE 2002 Custom Integrated Circuits Conference","acronym":"CICC-02","location":"Orlando, FL, USA"},"container-title":["Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7911\/21814\/01012811.pdf?arnumber=1012811","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T13:49:03Z","timestamp":1489153743000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1012811\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/cicc.2002.1012811","relation":{},"subject":[]}}