{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,2]],"date-time":"2025-06-02T22:02:14Z","timestamp":1748901734697},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/cicc.2002.1012887","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T21:52:33Z","timestamp":1056577953000},"page":"497-500","source":"Crossref","is-referenced-by-count":32,"title":["A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes"],"prefix":"10.1109","author":[{"given":"D.","family":"Ozis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Fiez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Mayaram","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.476576"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.494196"},{"journal-title":"Agilent EEsof Momentum Electromagnetic Design and Simulation Advanced Design System 1 5","year":"2000","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0965-9978(94)90027-2"},{"journal-title":"EPIC A Program for Extraction of the Resistance and Capacitance of Substrate With the Green's Function Method","year":"2001","author":"xu","key":"ref11"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.759076"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494356"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.845193"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.661197"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1995.518149"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.278344"}],"event":{"name":"IEEE 2002 Custom Integrated Circuits Conference","acronym":"CICC-02","location":"Orlando, FL, USA"},"container-title":["Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7911\/21814\/01012887.pdf?arnumber=1012887","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,11]],"date-time":"2017-03-11T01:24:53Z","timestamp":1489195493000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1012887\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/cicc.2002.1012887","relation":{},"subject":[]}}