{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T13:09:48Z","timestamp":1725628188457},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/cicc.2007.4405688","type":"proceedings-article","created":{"date-parts":[[2008,7,18]],"date-time":"2008-07-18T17:19:35Z","timestamp":1216401575000},"page":"89-91","source":"Crossref","is-referenced-by-count":7,"title":["Flash-based Field Programmable Gate Array Technology with Deep Trench Isolation"],"prefix":"10.1109","author":[{"given":"Kyung Joon","family":"Han","sequence":"first","affiliation":[]},{"given":"Nigel","family":"Chan","sequence":"additional","affiliation":[]},{"given":"Sungrae","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Ben","family":"Leung","sequence":"additional","affiliation":[]},{"given":"Volker","family":"Hecht","sequence":"additional","affiliation":[]},{"given":"Brian","family":"Cronquist","sequence":"additional","affiliation":[]},{"given":"Danny","family":"Shum","sequence":"additional","affiliation":[]},{"given":"Armin","family":"Tilke","sequence":"additional","affiliation":[]},{"given":"Laura","family":"Pescini","sequence":"additional","affiliation":[]},{"given":"Martin","family":"Stiftinger","sequence":"additional","affiliation":[]},{"given":"Ronald","family":"Kakoschke","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2004.04.014"},{"year":"0","key":"2"},{"key":"1","article-title":"a high density flash memory fpga family","author":"lipp","year":"2000","journal-title":"IEEE 2000 Custom Integrated Circuits Conference"},{"key":"6","first-page":"31","article-title":"a new programming disturbance phenomenon in nand flash memory by source\/drain hot electrons generated by gidl current","author":"lee","year":"2006","journal-title":"IEEE NVSM Workshop"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/.2006.1629478"},{"year":"0","key":"4"}],"event":{"name":"2007 IEEE Custom Integrated Circuits Conference","start":{"date-parts":[[2007,9,16]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2007,9,19]]}},"container-title":["2007 IEEE Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4405666\/4405667\/04405688.pdf?arnumber=4405688","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T20:18:31Z","timestamp":1489695511000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4405688\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/cicc.2007.4405688","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}