{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T21:29:26Z","timestamp":1725744566026},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/cicc.2007.4405767","type":"proceedings-article","created":{"date-parts":[[2008,7,18]],"date-time":"2008-07-18T13:19:35Z","timestamp":1216387175000},"page":"429-436","source":"Crossref","is-referenced-by-count":11,"title":["Reverse Engineering in the Semiconductor Industry"],"prefix":"10.1109","author":[{"given":"Randy","family":"Torrance","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dick","family":"James","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346879"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346878"},{"key":"1","article-title":"a case study: looking inside apple's ipod nano - a teardown to the atomic scale tbp","author":"james","year":"2007","journal-title":"Electronics (UK magazine)"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.884603"},{"year":"0","key":"6"},{"key":"5","first-page":"508","article-title":"a 1\/2.5 inch 8.-mpixel cmos image sensor for digital cameras","author":"cho","year":"2007","journal-title":"ISSCC Dig Tech Papers"},{"key":"4","first-page":"665","article-title":"a 65 nm cmos technology for mobile and digital signal processing applications","author":"chatterjee","year":"0","journal-title":"2004 IEDM Tech Dig"}],"event":{"name":"2007 IEEE Custom Integrated Circuits Conference","start":{"date-parts":[[2007,9,16]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2007,9,19]]}},"container-title":["2007 IEEE Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4405666\/4405667\/04405767.pdf?arnumber=4405767","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T18:42:31Z","timestamp":1489689751000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4405767\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/cicc.2007.4405767","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}