{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T12:54:45Z","timestamp":1730206485729,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,9]]},"DOI":"10.1109\/cicc.2008.4672056","type":"proceedings-article","created":{"date-parts":[[2008,11,25]],"date-time":"2008-11-25T15:46:18Z","timestamp":1227627978000},"page":"193-196","source":"Crossref","is-referenced-by-count":23,"title":["Variation-tolerant Spin-Torque Transfer (STT) MRAM array for yield enhancement"],"prefix":"10.1109","author":[{"given":"Jing","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Haixin Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sayeef","family":"Salahuddin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaushik","family":"Roy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346740"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1063\/1.372612"},{"key":"1","article-title":"stt-ram -a new spin on universal memory","volume":"23","author":"smith","year":"2007","journal-title":"Future Fab Intl"},{"journal-title":"Scalable CMOS Design Rules","year":"0","key":"6"},{"key":"5","first-page":"473","article-title":"a novel nonvolatile memory with spin torque transfer magnetization switching: spin-ram","author":"hosomi","year":"2006","journal-title":"IEDM Tech Dig"},{"year":"0","key":"4"}],"event":{"name":"2008 IEEE Custom Integrated Circuits Conference - CICC 2008","start":{"date-parts":[[2008,9,21]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,9,24]]}},"container-title":["2008 IEEE Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4665385\/4671999\/04672056.pdf?arnumber=4672056","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T17:11:33Z","timestamp":1489770693000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4672056\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/cicc.2008.4672056","relation":{},"subject":[],"published":{"date-parts":[[2008,9]]}}}