{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:11:35Z","timestamp":1764173495492},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,9]]},"DOI":"10.1109\/cicc.2008.4672096","type":"proceedings-article","created":{"date-parts":[[2008,11,25]],"date-time":"2008-11-25T15:46:18Z","timestamp":1227627978000},"page":"359-362","source":"Crossref","is-referenced-by-count":1,"title":["A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision"],"prefix":"10.1109","author":[{"given":"T.","family":"Copani","sequence":"first","affiliation":[]},{"given":"B.","family":"Vermeire","sequence":"additional","affiliation":[]},{"given":"A.","family":"Jain","sequence":"additional","affiliation":[]},{"given":"H.","family":"Karaki","sequence":"additional","affiliation":[]},{"given":"K.","family":"Chandrashekar","sequence":"additional","affiliation":[]},{"given":"S.","family":"Goswami","sequence":"additional","affiliation":[]},{"given":"J.","family":"Kitchen","sequence":"additional","affiliation":[]},{"given":"H. H.","family":"Chung","sequence":"additional","affiliation":[]},{"given":"I.","family":"Deligoz","sequence":"additional","affiliation":[]},{"given":"B.","family":"Bakkaloglu","sequence":"additional","affiliation":[]},{"given":"H.","family":"Barnaby","sequence":"additional","affiliation":[]},{"given":"S.","family":"Kiaei","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.876051"},{"year":"0","key":"1"}],"event":{"name":"2008 IEEE Custom Integrated Circuits Conference - CICC 2008","start":{"date-parts":[[2008,9,21]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,9,24]]}},"container-title":["2008 IEEE Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4665385\/4671999\/04672096.pdf?arnumber=4672096","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T20:24:01Z","timestamp":1489695841000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4672096\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/cicc.2008.4672096","relation":{},"subject":[],"published":{"date-parts":[[2008,9]]}}}