{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:39:43Z","timestamp":1725784783816},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,9]]},"DOI":"10.1109\/cicc.2009.5280732","type":"proceedings-article","created":{"date-parts":[[2009,10,12]],"date-time":"2009-10-12T15:41:30Z","timestamp":1255362090000},"page":"705-708","source":"Crossref","is-referenced-by-count":13,"title":["Low-overhead, digital offset compensated, SRAM sense amplifiers"],"prefix":"10.1109","author":[{"given":"Mudit","family":"Bhargava","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark P.","family":"McCartney","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Hoefler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ken","family":"Mai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/4.173092"},{"journal-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"2003","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/.2005.1469239"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021925"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839772"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.826317"},{"article-title":"On-Chip Wires: Scaling and Efficiency","year":"2003","author":"ho","key":"9"},{"key":"8","article-title":"Mismatch Analysis and Statistical Design at 65nm and Below","author":"pileggi","year":"2008","journal-title":"Proc IEEE Custom Intergr Circuits Conf"}],"event":{"name":"2009 IEEE Custom Integrated Circuits Conference (CICC)","start":{"date-parts":[[2009,9,13]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2009,9,16]]}},"container-title":["2009 IEEE Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5268172\/5280726\/05280732.pdf?arnumber=5280732","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T23:45:33Z","timestamp":1489880733000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5280732\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/cicc.2009.5280732","relation":{},"subject":[],"published":{"date-parts":[[2009,9]]}}}