{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:46:32Z","timestamp":1759146392924},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/cicc.2010.5617596","type":"proceedings-article","created":{"date-parts":[[2010,11,10]],"date-time":"2010-11-10T20:53:49Z","timestamp":1289422429000},"page":"1-4","source":"Crossref","is-referenced-by-count":16,"title":["82 dB SNDR 20-channel incremental ADC with optimal decimation filter and digital correction"],"prefix":"10.1109","author":[{"given":"Wenhuan","family":"Yu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehmet","family":"Aslan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gabor C.","family":"Temes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"A Digital Calibration Technique for DAC Mismatches in Delta-Sigma Modulators","author":"yu","year":"2009","journal-title":"IEEE Int Symp on Circuits and Systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.916676"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.910473"},{"journal-title":"A dual-path 2-0 MASH ADC with dual digital error correction","year":"2007","author":"zhang","key":"ref5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.173122"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.873891"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"63","DOI":"10.1016\/S1388-2457(02)00337-1","article-title":"Epileptic source location with high-density EEG: how many electrodes are needed?","author":"lantz","year":"2003","journal-title":"Clinical Neurophysiology"}],"event":{"name":"2010 IEEE Custom Integrated Circuits Conference -CICC 2010","start":{"date-parts":[[2010,9,19]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,9,22]]}},"container-title":["IEEE Custom Integrated Circuits Conference 2010"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5605059\/5617377\/05617596.pdf?arnumber=5617596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T16:00:39Z","timestamp":1497888039000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5617596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/cicc.2010.5617596","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}