{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:18:54Z","timestamp":1725463134548},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/cicc.2012.6330574","type":"proceedings-article","created":{"date-parts":[[2012,10,19]],"date-time":"2012-10-19T00:50:31Z","timestamp":1350607831000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Impact of subthreshold hump on bulk-bias dependence of offset voltage variability in weak and moderate inversion regions"],"prefix":"10.1109","author":[{"given":"K.","family":"Sakakibara","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Kumamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Arimoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.899080"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884195"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2005.1452215"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377907"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2003.1257224"},{"journal-title":"Charge-Based MOS Transistor Modeling","year":"2009","author":"enz","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/4.488004"},{"key":"4","first-page":"78","article-title":"A Single-Trim CMOS Bandgap Reference with a 3o? Inaccuracy of +\/-0.15% from -40deg-C to 125deg-C","author":"ge","year":"2010","journal-title":"ISSCC Tech Dig"},{"key":"9","first-page":"829","article-title":"An Accurate Prediction Model of Temperature Dependence Current Mismatch in All Inversion and Influence of Subthreshold Hump on Mismatch Characteristics","author":"sakakibara","year":"2011","journal-title":"Extended Abstracts SSDM"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2020524"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"}],"event":{"name":"2012 IEEE Custom Integrated Circuits Conference - CICC 2012","start":{"date-parts":[[2012,9,9]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2012,9,12]]}},"container-title":["Proceedings of the IEEE 2012 Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6320859\/6330557\/06330574.pdf?arnumber=6330574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T22:50:24Z","timestamp":1490136624000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6330574\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/cicc.2012.6330574","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}