{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:45:07Z","timestamp":1772041507764,"version":"3.50.1"},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/cicc.2012.6330672","type":"proceedings-article","created":{"date-parts":[[2012,10,19]],"date-time":"2012-10-19T00:50:31Z","timestamp":1350607831000},"page":"1-4","source":"Crossref","is-referenced-by-count":20,"title":["6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOS"],"prefix":"10.1109","author":[{"given":"Cagla","family":"Cakir","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mudit","family":"Bhargava","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ken","family":"Mai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2011.6004692"},{"key":"2","first-page":"4","article-title":"Data remanence in semiconductor devices","volume":"10","author":"gutmann","year":"2001","journal-title":"Proceedings of the 10th conference on USENIX Security Symposium"},{"key":"1","first-page":"45","article-title":"Lest we remember: Cold boot attacks on encryption keys","author":"halderman","year":"2008","journal-title":"USENIX Security Symposium"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"}],"event":{"name":"2012 IEEE Custom Integrated Circuits Conference - CICC 2012","location":"San Jose, CA, USA","start":{"date-parts":[[2012,9,9]]},"end":{"date-parts":[[2012,9,12]]}},"container-title":["Proceedings of the IEEE 2012 Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6320859\/6330557\/06330672.pdf?arnumber=6330672","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T22:07:53Z","timestamp":1490134073000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6330672\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/cicc.2012.6330672","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}