{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:30:37Z","timestamp":1725784237175},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/cicc.2012.6330675","type":"proceedings-article","created":{"date-parts":[[2012,10,19]],"date-time":"2012-10-19T00:50:31Z","timestamp":1350607831000},"page":"1-4","source":"Crossref","is-referenced-by-count":11,"title":["A non-iterative physical procedure for RF CMOS compact model extraction using BSIM6"],"prefix":"10.1109","author":[{"given":"Sriramkumar","family":"Venugopalan","sequence":"first","affiliation":[]},{"given":"Krishnanshu","family":"Dandu","sequence":"additional","affiliation":[]},{"given":"Samuel","family":"Martin","sequence":"additional","affiliation":[]},{"given":"Richard","family":"Taylor","sequence":"additional","affiliation":[]},{"given":"Claude","family":"Cirba","sequence":"additional","affiliation":[]},{"given":"Xin","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Ali M.","family":"Niknejad","sequence":"additional","affiliation":[]},{"given":"Chenming","family":"Hu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MIXDES.2007.4286123"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.850656"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/16.796299"},{"key":"7","first-page":"961","article-title":"An effective gate resistance model for CMOS RF and noise modeling","author":"jin","year":"1998","journal-title":"IEDM '98 Technical Digest"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2007.08.015"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.881005"},{"journal-title":"BSIM6 Technical Manual","year":"0","key":"4"}],"event":{"name":"2012 IEEE Custom Integrated Circuits Conference - CICC 2012","start":{"date-parts":[[2012,9,9]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2012,9,12]]}},"container-title":["Proceedings of the IEEE 2012 Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6320859\/6330557\/06330675.pdf?arnumber=6330675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T22:16:29Z","timestamp":1490134589000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6330675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/cicc.2012.6330675","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}