{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T13:08:47Z","timestamp":1725800927479},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/cicc.2013.6658430","type":"proceedings-article","created":{"date-parts":[[2013,11,21]],"date-time":"2013-11-21T10:50:54Z","timestamp":1385031054000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["SRAM read current variability and its dependence on transistor statistics"],"prefix":"10.1109","author":[{"given":"Sriramkumar","family":"Venugopalan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vivek","family":"Joshi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luis","family":"Zamudio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matthias","family":"Goldbach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gert","family":"Burbach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ralf","family":"Van Bentum","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sriram","family":"Balasubramanian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2007.4339737"},{"key":"2","first-page":"220","article-title":"Non-Gaussian distribution of sram read current and design impact to low power memory using voltage acceleration method","author":"wang","year":"2011","journal-title":"Symposium on VLSI Technology Digest"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.883344"}],"event":{"name":"2013 IEEE Custom Integrated Circuits Conference - CICC 2013","start":{"date-parts":[[2013,9,22]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2013,9,25]]}},"container-title":["Proceedings of the IEEE 2013 Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6648471\/6658393\/06658430.pdf?arnumber=6658430","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T20:50:56Z","timestamp":1490215856000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6658430\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/cicc.2013.6658430","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}