{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:04:58Z","timestamp":1729670698660,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/cicc.2014.6945994","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T17:50:10Z","timestamp":1415814610000},"page":"1-8","source":"Crossref","is-referenced-by-count":1,"title":["Design for test of a mm-Wave ADPLL-based transmitter"],"prefix":"10.1109","author":[{"given":"Wanghua","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R. Bogdan","family":"Staszewski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John R.","family":"Long","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.857417"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2301764"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.886896"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2282701"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.858754"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1995.518238"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1997.606615"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DCAS.2006.321033"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.886202"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E94.C.930"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DCAS.2010.5955030"},{"journal-title":"An Introduction to Mixed Signal IC Test and Measurement","year":"2001","author":"bums","key":"ref2"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"141","DOI":"10.1109\/82.917782","article-title":"An all-digital built-in self-test for high-speed phase-locked loops","volume":"48","author":"kim","year":"2001","journal-title":"IEEE Trans on Circuits and Systems II"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746324"}],"event":{"name":"2014 IEEE Custom Integrated Circuits Conference - CICC 2014","start":{"date-parts":[[2014,9,15]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2014,9,17]]}},"container-title":["Proceedings of the IEEE 2014 Custom Integrated Circuits Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6924030\/6945974\/06945994.pdf?arnumber=6945994","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T20:03:28Z","timestamp":1498161808000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6945994\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/cicc.2014.6945994","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}