{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:45:14Z","timestamp":1761648314754},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/cicc.2015.7338360","type":"proceedings-article","created":{"date-parts":[[2015,11,30]],"date-time":"2015-11-30T21:52:45Z","timestamp":1448920365000},"page":"1-4","source":"Crossref","is-referenced-by-count":7,"title":["A 298-fJ\/writecycle 650-fJ\/readcycle 8T three-port SRAM in 28-nm FD-SOI process technology for image processor"],"prefix":"10.1109","author":[{"given":"Haruki","family":"Mori","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Nakagawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Kitahara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Kawamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Takagi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Yoshimoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Izumi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Nii","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Kawaguchi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Yoshimoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"267","article-title":"Fully-Depleted SOI Technology using High-K and Single-Metal Gate for 32nm Node LSTP Applications featuring 0.179µm2 6T -SRAM bitcell","author":"fenouillet-beranger","year":"2007","journal-title":"IEEE IEDM"},{"key":"ref3","first-page":"424","article-title":"Ultra-Wide Body-Bias Range LDPC Decoder in 28-nm UTBB FDSOI Technology","author":"flatresse","year":"2013","journal-title":"ISSCC Dig of Tech Papers"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000249"},{"key":"ref6","first-page":"93","article-title":"An Inter-Die Variability Compensation Scheme for 0.42-V 486-kb FD-SOI SRAM using Substrate Control","author":"fujiwara","year":"2008","journal-title":"IEEE Int SOI Conf"},{"key":"ref5","first-page":"1","article-title":"6T SRAM Design for Wide Voltage Range in 28-nm FDSOI","author":"thomas","year":"2012","journal-title":"IEEE Int SOI Conf"},{"key":"ref8","first-page":"72","article-title":"A 40-nm 0.5-V 20.1-µW\/MHz 8T SRAM with Low-Energy Disturb Mitigation Scheme","author":"yoshimoto","year":"2011","journal-title":"IEEE Symposium on VLSI Circuits"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703338"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242497"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2296137"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e88-c.4.559"}],"event":{"name":"2015 IEEE Custom Integrated Circuits Conference - CICC 2015","start":{"date-parts":[[2015,9,28]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2015,9,30]]}},"container-title":["2015 IEEE Custom Integrated Circuits Conference (CICC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7321938\/7338356\/07338360.pdf?arnumber=7338360","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T02:11:05Z","timestamp":1490407865000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7338360\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/cicc.2015.7338360","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}