{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T23:05:51Z","timestamp":1747868751609,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/cicc.2015.7338418","type":"proceedings-article","created":{"date-parts":[[2015,11,30]],"date-time":"2015-11-30T21:52:45Z","timestamp":1448920365000},"page":"1-4","source":"Crossref","is-referenced-by-count":11,"title":["Timing in-situ monitors: Implementation strategy and applications results"],"prefix":"10.1109","author":[{"given":"A.","family":"Benhassain","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Cacho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Huard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Saliva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Anghel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Parthasarathy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Jain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Giner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"Digial circuits reliability with in-situ monitors in 28nm fully depleted SOI","author":"saliva","year":"2015","journal-title":"IEEE\/DATE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429543"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112761"},{"key":"ref6","article-title":"RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance","author":"blaauw","year":"2009","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870912"},{"key":"ref8","article-title":"A Variation-Aware Adaptive Voltage Scaling Technique Based on In-situ Delay monitoring","author":"wirnshofer","year":"2012","journal-title":"IEEE\/DDECS"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681644"},{"key":"ref9","article-title":"SlackProbe: A flexible and efficient in situ timing slack monitoring methodology","volume":"33","author":"lai","year":"2014","journal-title":"T-CAD"},{"key":"ref1","article-title":"Adaptative wear out management with in-situ management","author":"huard","year":"2014","journal-title":"IRPS"}],"event":{"name":"2015 IEEE Custom Integrated Circuits Conference - CICC 2015","start":{"date-parts":[[2015,9,28]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2015,9,30]]}},"container-title":["2015 IEEE Custom Integrated Circuits Conference (CICC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7321938\/7338356\/07338418.pdf?arnumber=7338418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T02:15:34Z","timestamp":1490408134000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7338418\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/cicc.2015.7338418","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}